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Total properties:
30
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Patent #:
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|
Issue Dt:
|
08/06/1985
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Application #:
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06516827
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Filing Dt:
|
07/25/1983
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Title:
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SAMPLE VESSEL
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|
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Patent #:
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|
Issue Dt:
|
04/21/1987
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Application #:
|
06833575
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Filing Dt:
|
02/26/1986
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Title:
|
VACUUM-COMPATIBLE AIR-COOLED PLASMA DEVICE
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|
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Patent #:
|
|
Issue Dt:
|
03/07/1989
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Application #:
|
07058437
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Filing Dt:
|
06/05/1987
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Title:
|
DIRECT IMAGING MONOCHROMATIC ELECTRON MICROSCOPE
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|
|
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Patent #:
|
|
Issue Dt:
|
04/12/1988
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Application #:
|
07063806
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Filing Dt:
|
06/24/1987
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|
Title:
|
ENERGY AND ANALYSIS DETECTION SYSTEM FOR SURFACE CHEMICAL ANALYSIS
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Patent #:
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|
Issue Dt:
|
06/18/1991
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Application #:
|
07254442
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Filing Dt:
|
10/06/1988
|
|
Title:
|
RESISTIVE ANODE ENCODER TARGET AND METHOD PRODUCING BOTH CHARGED AND VISUAL IMAGES
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|
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Patent #:
|
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Issue Dt:
|
11/21/1989
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Application #:
|
07268440
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Filing Dt:
|
11/08/1988
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|
Title:
|
DIRECT IMAGING MONOCHROMATIC ELECTRON MICROSCOPE
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|
|
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Patent #:
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|
Issue Dt:
|
07/07/1992
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Application #:
|
07425568
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Filing Dt:
|
10/23/1989
|
|
Title:
|
PARTICLE ANALYZER APPARATUS AND METHOD
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|
|
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Patent #:
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|
Issue Dt:
|
07/16/1991
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Application #:
|
07565289
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Filing Dt:
|
08/09/1990
|
|
Title:
|
MULTICHANNEL CHARGED-PARTICLE ANALYZER
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|
|
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Patent #:
|
|
Issue Dt:
|
12/01/1992
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Application #:
|
07579331
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Filing Dt:
|
09/06/1990
|
|
Title:
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PLASMA ETCHING METHOD AND APPARATUS
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|
|
|
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Patent #:
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|
Issue Dt:
|
06/02/1992
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Application #:
|
07690870
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Filing Dt:
|
04/23/1991
|
|
Title:
|
APPARATUS AND METHOD FOR LOCATING TARGET AREA FOR ELECTRON MICRO- ANALYSIS
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|
|
|
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Patent #:
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|
Issue Dt:
|
05/25/1993
|
Application #:
|
07809691
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Filing Dt:
|
12/17/1991
|
|
Title:
|
SUSPENSION SYSTEM FOR ISOLATING VIBRATIONS
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|
|
|
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Patent #:
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|
Issue Dt:
|
06/08/1993
|
Application #:
|
07863640
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Filing Dt:
|
04/06/1992
|
|
Title:
|
APPARATUS FOR RETAINING AN ELECTRODE BY A MAGNETICALLY SHIELDED MAGNET
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|
|
|
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Patent #:
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|
Issue Dt:
|
02/09/1993
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Application #:
|
07869561
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Filing Dt:
|
04/15/1992
|
|
Title:
|
MECHANISM FOR POSITIONING A CARRIER
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|
|
|
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Patent #:
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|
Issue Dt:
|
05/24/1994
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Application #:
|
07953429
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Filing Dt:
|
09/29/1992
|
|
Title:
|
SCANNING AND HIGH RESOLUTION X-RAY PHOTOELECTRON SPECTROSCOPY AND IMAGING
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|
|
|
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Patent #:
|
|
Issue Dt:
|
07/11/1995
|
Application #:
|
07958249
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Filing Dt:
|
10/08/1992
|
|
Title:
|
METHOD AND APPARATUS FOR CONTROL OF SURFACE POTENTIAL
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|
|
|
|
Patent #:
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|
Issue Dt:
|
08/22/1995
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Application #:
|
08201912
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Filing Dt:
|
02/25/1994
|
|
Title:
|
SCANNING AND HIGH RESOLUTION ELECTRON SPECTROSCOPY AND IMAGING
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|
|
|
|
Patent #:
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|
Issue Dt:
|
02/11/1997
|
Application #:
|
08593308
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Filing Dt:
|
01/31/1996
|
|
Title:
|
ANODE ASSEMBLY FOR GENERATING X-RAYS AND INSTRUMENT WITH SUCH ANODE ASSEMBLY
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/10/1997
|
Application #:
|
08618599
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Filing Dt:
|
03/20/1996
|
|
Title:
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FOCUSED ION BEAM COLUMN WITH ELECTRICALLY VARIABLE BLANKING APERTURE
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|
|
|
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Patent #:
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|
Issue Dt:
|
11/23/1999
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Application #:
|
08968454
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Filing Dt:
|
11/12/1997
|
|
Title:
|
CONTROL OF SURFACE POTENTIAL OF INSULATING SPECIMENS IN SURFACE ANALYSIS
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|
|
|
|
Patent #:
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|
Issue Dt:
|
05/10/2005
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Application #:
|
10330317
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Filing Dt:
|
12/27/2002
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|
Publication #:
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|
Pub Dt:
|
07/01/2004
| | | | |
|
Title:
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NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS BASED ON ACQUIRED SPECTRUM
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|
|
|
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Patent #:
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|
Issue Dt:
|
10/05/2004
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Application #:
|
10330383
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Filing Dt:
|
12/27/2002
|
|
Publication #:
|
|
Pub Dt:
|
07/15/2004
| | | | |
|
Title:
|
NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS USING MEASURED BASIS SPECTRA
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|
|
|
|
Patent #:
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|
Issue Dt:
|
11/11/2008
|
Application #:
|
10493492
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Filing Dt:
|
04/22/2004
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|
Publication #:
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|
Pub Dt:
|
12/02/2004
| | | | |
|
Title:
|
SYSTEM AND METHOD FOR DEPTH PROFILING AND CHARACTERIZATION OF THIN FILMS
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|
|
|
|
Patent #:
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|
Issue Dt:
|
07/14/2009
|
Application #:
|
11023271
|
Filing Dt:
|
12/22/2004
|
|
Title:
|
ELECTRONIC DEVICE INCORPORATING A MULTILAYERED CAPACITOR FORMED ON A PRINTED CIRCUIT BOARD
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|
|
|
|
Patent #:
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|
Issue Dt:
|
05/18/2010
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Application #:
|
11040329
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Filing Dt:
|
01/20/2005
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|
Publication #:
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Pub Dt:
|
08/24/2006
| | | | |
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Title:
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SEMICONDUCTOR SUBSTRATE PROCESSING METHOD AND APPARATUS
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|
|
|
|
Patent #:
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|
Issue Dt:
|
09/02/2008
|
Application #:
|
11118035
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Filing Dt:
|
04/29/2005
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|
Publication #:
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|
Pub Dt:
|
11/02/2006
| | | | |
|
Title:
|
DETERMINING LAYER THICKNESS USING PHOTOELECTRON SPECTROSCOPY
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|
|
|
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Patent #:
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|
Issue Dt:
|
06/12/2007
|
Application #:
|
11118683
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Filing Dt:
|
04/29/2005
|
|
Publication #:
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Pub Dt:
|
11/02/2006
| | | | |
|
Title:
|
TECHNIQUES FOR ANALYZING DATA GENERATED BY INSTRUMENTS
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/12/2008
|
Application #:
|
11218114
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Filing Dt:
|
08/31/2005
|
|
Publication #:
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|
Pub Dt:
|
01/11/2007
| | | | |
|
Title:
|
METHOD AND SYSTEM FOR NON-DESTRUCTIVE DISTRIBUTION PROFILING OF AN ELEMENT IN A FILM
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/15/2008
|
Application #:
|
11228685
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Filing Dt:
|
09/15/2005
|
|
Title:
|
DIAMOND ANODE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/15/2008
|
Application #:
|
11237041
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Filing Dt:
|
09/27/2005
|
|
Publication #:
|
|
Pub Dt:
|
03/29/2007
| | | | |
|
Title:
|
PHOTOELECTRON SPECTROSCOPY APPARATUS AND METHOD OF USE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/25/2008
|
Application #:
|
11395189
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Filing Dt:
|
03/30/2006
|
|
Title:
|
CALIBRATING MULTIPLE PHOTOELECTRON SPECTROSCOPY SYSTEMS
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|
