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Reel/Frame:016340/0013   Pages: 3
Recorded: 02/28/2005
Attorney Dkt #:93970
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
09/28/2010
Application #:
11068711
Filing Dt:
02/28/2005
Publication #:
Pub Dt:
08/31/2006
Title:
METHOD AND APPARATUS FOR DETECTING DEFECTS IN WAFERS INCLUDING ALIGNMENT OF THE WAFER IMAGES SO AS TO INDUCE THE SAME SMEAR IN ALL IMAGES
Assignors
1
Exec Dt:
02/22/2005
2
Exec Dt:
02/22/2005
3
Exec Dt:
02/22/2005
4
Exec Dt:
02/22/2005
5
Exec Dt:
02/22/2005
Assignee
1
12 HAMADA STREET
REHOVOT, ISRAEL 76701
Correspondence name and address
GERALD T. SHEKLETON
WELSH & KATZ, LTD.
120 SOUTH RIVERSIDE PLAZA
22ND FLOOR
CHICAGO, ILLINOIS 60606

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