Patent Assignment Details
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| Reel/Frame: | 008534/0039 | |
| Pages: | 4 |
| | Recorded: | 04/24/1997 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/11/2000
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Application #:
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08847513
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Filing Dt:
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04/24/1997
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Title:
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NEW TEST STRUCTURE FOR MONITORING OVERETCHING OF SILICIDE DURING CONTACT OPENING
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Assignee
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| 18 FLOOR, NO. 106, SEC. 2 |
| HO-PIN E. ROAD |
| TAIPEI, R.O.C., TAIWAN |
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Correspondence name and address
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BEVERIDGE, DEGRANDI, WEILACHER & YOUNG
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JOSEPH A. DEGRANDI
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1850 M ST., NW
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SUITE 800
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WASHINGTON, DC 20036
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