Patent Assignment Details
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Reel/Frame: | 015715/0042 | |
| Pages: | 28 |
| | Recorded: | 08/20/2004 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/11/2008
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Application #:
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10493492
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Filing Dt:
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04/22/2004
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Publication #:
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Pub Dt:
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12/02/2004
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Title:
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SYSTEM AND METHOD FOR DEPTH PROFILING AND CHARACTERIZATION OF THIN FILMS
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Assignee
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810 KIFER ROAD |
SUNNYVALE, CALIFORNIA 94086 |
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Correspondence name and address
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BLAKELY, SOKOLOFF, TAYLOR & ZAFMAN LLP
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MICHAEL A. BERNADICOU
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12400 WILSHIRE BOULEVARD
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7TH FLOOR
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LOS ANGELES, CA 90025
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