Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 017125/0042 | |
| Pages: | 4 |
| | Recorded: | 02/06/2006 | | |
| Conveyance: | MERGER (SEE DOCUMENT FOR DETAILS). |
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Total properties:
9
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Patent #:
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Issue Dt:
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06/06/1995
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Application #:
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08004447
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Filing Dt:
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01/14/1993
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Title:
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LARGE SCALE PROTRUSION MEMBRANE FOR SEMICONDUCTOR DEVICES UNDER TEST WITH VERY HIGH PIN COUNTS
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Patent #:
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Issue Dt:
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02/24/1998
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Application #:
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08440521
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Filing Dt:
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05/12/1995
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Title:
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METHOD FOR MAKING A PROBE PRESERVING A UNIFORM STRESS DISTRIBUTION UNDER DEFLECTION
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Patent #:
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Issue Dt:
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04/21/1998
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Application #:
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08553069
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Filing Dt:
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11/03/1995
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Title:
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MEMBRANE FOR HOLDING A PROBE TIP IN PROPER LOCATION
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Patent #:
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Issue Dt:
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07/01/1997
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Application #:
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08659861
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Filing Dt:
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06/07/1996
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Title:
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METHOD AND CIRCUIT TESTING APPARATUS FOR EQUALIZING A CONTACT FORCE BETWEEN PROBES AND PADS
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Patent #:
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Issue Dt:
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05/12/1998
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Application #:
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08681226
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Filing Dt:
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07/22/1996
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Title:
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METHOD AND APPARATUS FOR ALIGNING PROBES
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Patent #:
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Issue Dt:
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06/09/1998
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Application #:
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08771274
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Filing Dt:
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12/20/1996
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Title:
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DUAL CONTACT PROBE ASSEMBLY FOR TESTING INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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03/23/1999
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Application #:
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08835078
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Filing Dt:
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04/04/1997
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Title:
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ASSEMBLY STRUCTURE FOR MAKING INTEGRATED CIRCUIT CHIP PROBE CARDS
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Patent #:
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Issue Dt:
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05/16/2000
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Application #:
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09057080
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Filing Dt:
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04/08/1998
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Title:
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HIGH TEMPERATURE PROBE CARD FOR TESTING INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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06/20/2006
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Application #:
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09775676
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Filing Dt:
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02/01/2001
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Publication #:
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Pub Dt:
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08/01/2002
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Title:
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BUNDLED PROBE APPARATUS FOR MULTIPLE TERMINAL CONTACTING
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Assignee
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| 1209 ORANGE STREET |
| WILMINGTON, DELAWARE 19801 |
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Correspondence name and address
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CHRISTOPHER M. SPLETZER, SR.
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KULICKE AND SOFFA INDUSTRIES, INC.
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2101 BLAIR MILL ROAD
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WILLOW GROVE, PA 19090
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