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Patent Assignment Details

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Reel/Frame:	005315/0070			Pages:	8
		Recorded:	02/02/1990
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST.

Total properties: 28

Patent #:	3271572	Issue Dt:		Application #:	04219322	Filing Dt:
Title:

Patent #:	3529165	Issue Dt:		Application #:	04501439	Filing Dt:
Title:

Patent #:	3720833	Issue Dt:		Application #:	05141496	Filing Dt:
Title:

Patent #:	3766470	Issue Dt:		Application #:	05146256	Filing Dt:
Title:

Patent #:	3786686	Issue Dt:		Application #:	05237213	Filing Dt:
Title:

Patent #:	3855215	Issue Dt:		Application #:	05330357	Filing Dt:
Title:

Patent #:	4042880	Issue Dt:		Application #:	05528993	Filing Dt:
Title:

Patent #:	4046994	Issue Dt:		Application #:	05631376	Filing Dt:
Title:

Patent #:	4079327	Issue Dt:		Application #:	05733873	Filing Dt:
Title:

Patent #:	4155009	Issue Dt:		Application #:	05785530	Filing Dt:
Title:

Patent #:	4115690	Issue Dt:		Application #:	05803250	Filing Dt:
Title:

Patent #:	4190770	Issue Dt:		Application #:	05851735	Filing Dt:
Title:

Patent #:	4229652	Issue Dt:	10/21/1980	Application #:	05911974	Filing Dt:	06/02/1978
Title:	BACKSCATTER APPARATUS AND METHOD FOR MEASURING THICKNESS OF A CONTINUO USLY MOVING COATED STRIP OF SUBSTRATE MATERIAL

Patent #:	4245189	Issue Dt:	01/13/1981	Application #:	06048547	Filing Dt:	06/14/1979
Title:	PROBE ASSEMBLY FOR MEASURING CONDUCTIVITY OF PLATED THROUGH HOLES

Patent #:	4343092	Issue Dt:	08/10/1982	Application #:	06130971	Filing Dt:	03/17/1980
Title:	PROBE GUIDE AND HOLDER

Patent #:	4437000	Issue Dt:	03/13/1984	Application #:	06245936	Filing Dt:	03/20/1981
Title:	APERTURE PIECE AND METHOD FOR CALIBRATING BACKSCATTER THICKNESS MEASURING INSTRUMENTS FOR MEASURING CONCAVE WORKPIECES

Patent #:	4449048	Issue Dt:	05/15/1984	Application #:	06426717	Filing Dt:	09/29/1982
Title:	WORKPIECE POSITIONING SYSTEM FOR BETA RAY MEASURING INSTRUMENTS

Patent #:	4560464	Issue Dt:	12/24/1985	Application #:	06553546	Filing Dt:	11/21/1983
Title:	STICK-ON-MASK FOR USE WITH COULOMETRIC MEASURING INSTRUMENTS

Patent #:	4646341	Issue Dt:	02/24/1987	Application #:	06716986	Filing Dt:	03/28/1985
Title:	CALIBRATION STANDARD FOR X-RAY FLUORESCENCE THICKNESS

Patent #:	4707657	Issue Dt:	11/17/1987	Application #:	06770867	Filing Dt:	08/12/1985
Title:	CONNECTOR ASSEMBLY FOR A CIRCUIT BOARD TESTING MACHINE, A CIRCUIT BOARD TESTING MACHING, AND A METHOD OF TESTING A CIRCUIT BOARD BY MEANS OF A CIRCUIT BOARD TESTING MACHINE

Patent #:	4860329	Issue Dt:	08/22/1989	Application #:	06832479	Filing Dt:	02/24/1986
Title:	X RAY FLUORESCENCE THICKNESS MEASURING DEVICE

Patent #:	4949783	Issue Dt:	08/21/1990	Application #:	07195707	Filing Dt:	05/18/1988
Title:	SUBSTRATE TRANSPORT AND COOLING APPARATUS AND METHOD FOR SAME

Patent #:	3421000	Issue Dt:		Application #:	UNAVAILABLE	Filing Dt:
Title:

Patent #:	3588507	Issue Dt:		Application #:	UNAVAILABLE	Filing Dt:
Title:

Patent #:	3560742	Issue Dt:		Application #:	UNAVAILABLE	Filing Dt:
Title:

Patent #:	3456115	Issue Dt:		Application #:	UNAVAILABLE	Filing Dt:
Title:

Patent #:	3496359	Issue Dt:		Application #:	UNAVAILABLE	Filing Dt:
Title:

Patent #:	3519824	Issue Dt:		Application #:	UNAVAILABLE	Filing Dt:
Title:

Assignor

Exec Dt:

01/17/1990

Assignee

ERMINAL DRIVE, A DE CORP.

PLAINVIEW, NEW YORK 11803

Correspondence name and address
	KAYE, SCHOLER, FIERMAN, HAYS & HANDLER
	425 PARK AVENUE
	NEW YORK, NY 10022

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