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Reel/Frame:057388/0077   Pages: 15
Recorded: 09/05/2021
Attorney Dkt #:2701-US1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
09/19/2023
Application #:
17400157
Filing Dt:
08/12/2021
Publication #:
Pub Dt:
02/03/2022
Title:
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
Assignors
1
Exec Dt:
08/02/2021
2
Exec Dt:
02/05/2021
3
Exec Dt:
12/27/2020
4
Exec Dt:
04/30/2021
5
Exec Dt:
04/30/2021
6
Exec Dt:
12/31/2020
7
Exec Dt:
04/30/2021
8
Exec Dt:
05/02/2021
9
Exec Dt:
02/04/2021
10
Exec Dt:
12/22/2020
11
Exec Dt:
04/30/2021
Assignee
1
5 DAVID FIKES ST.
REHOVOT, ISRAEL 7632805
Correspondence name and address
DANIEL J. SWIRSKY
11 REUVEN STREET
BEIT SHEMESH, 9954419 ISRAEL

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