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Patent #:
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Issue Dt:
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03/23/2004
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Application #:
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10267366
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Filing Dt:
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10/09/2002
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Publication #:
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Pub Dt:
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05/08/2003
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Title:
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THERMOGRAVIMETRY APPARATUS
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Patent #:
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Issue Dt:
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03/08/2005
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Application #:
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10308796
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Filing Dt:
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12/03/2002
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Publication #:
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Pub Dt:
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07/03/2003
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Title:
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PROBE FOR SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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08/23/2005
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Application #:
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10395683
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Filing Dt:
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03/24/2003
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Publication #:
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Pub Dt:
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02/12/2004
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Title:
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HEATED SELF-DETECTING TYPE CANTILEVER FOR ATOMIC FORCE MICROSCOPE
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Patent #:
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Issue Dt:
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06/14/2005
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Application #:
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10417906
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Filing Dt:
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04/17/2003
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Publication #:
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Pub Dt:
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02/12/2004
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Title:
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CALORIMETER
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Patent #:
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Issue Dt:
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12/13/2005
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Application #:
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10417907
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Filing Dt:
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04/17/2003
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Publication #:
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Pub Dt:
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01/22/2004
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Title:
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RADIATION DETECTOR
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Patent #:
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Issue Dt:
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05/25/2004
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Application #:
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10438040
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Filing Dt:
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05/14/2003
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Publication #:
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Pub Dt:
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11/27/2003
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Title:
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ELECTRON BEAM APPARATUS
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Patent #:
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Issue Dt:
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09/27/2005
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Application #:
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10438145
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Filing Dt:
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05/14/2003
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Publication #:
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Pub Dt:
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12/18/2003
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Title:
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ELECTRON BEAM APPARATUS
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Patent #:
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Issue Dt:
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04/04/2006
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Application #:
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10443225
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Filing Dt:
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05/22/2003
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Publication #:
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Pub Dt:
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11/27/2003
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Title:
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RADIATION DETECTOR
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Patent #:
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Issue Dt:
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11/20/2007
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Application #:
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10520982
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Filing Dt:
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03/14/2005
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Publication #:
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Pub Dt:
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10/27/2005
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Title:
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ION BEAM DEVICE AND ION BEAM PROCESSING METHOD, AND HOLDER MEMBER
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Patent #:
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Issue Dt:
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10/02/2007
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Application #:
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10525311
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Filing Dt:
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04/18/2005
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Publication #:
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Pub Dt:
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07/27/2006
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Title:
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ION BEAM DEVICE AND ION BEAM PROCESSING METHOD
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Patent #:
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Issue Dt:
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01/29/2008
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Application #:
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10543843
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Filing Dt:
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10/03/2005
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Publication #:
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Pub Dt:
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05/11/2006
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Title:
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ION BEAM PROCESSING METHOD
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Patent #:
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Issue Dt:
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04/20/2010
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Application #:
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10563515
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Filing Dt:
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02/02/2006
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Publication #:
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Pub Dt:
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07/20/2006
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Title:
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METHOD OF MAKING LAMINA SPECIMEN
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Patent #:
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Issue Dt:
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06/23/2009
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Application #:
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10592844
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Filing Dt:
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11/20/2006
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Publication #:
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Pub Dt:
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08/02/2007
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Title:
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ATOM PROBE APPARATUS AND METHOD FOR WORKING SAMPLE PRELIMINARILY FOR THE SAME
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Patent #:
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Issue Dt:
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11/30/2004
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Application #:
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10612567
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Filing Dt:
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07/02/2003
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Publication #:
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Pub Dt:
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02/19/2004
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Title:
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FINE STENCIL STRUCTURE CORRECTION DEVICE
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Patent #:
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Issue Dt:
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01/04/2005
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Application #:
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10629217
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Filing Dt:
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07/29/2003
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Title:
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ION BEAM APPARATUS, ION BEAM PROCESSING METHOD AND SAMPLE HOLDER MEMBER
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Patent #:
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Issue Dt:
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03/22/2005
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Application #:
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10644696
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Filing Dt:
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08/20/2003
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Publication #:
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Pub Dt:
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07/08/2004
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Title:
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APPARATUS FOR PROCESSING AND OBSERVING A SAMPLE
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Patent #:
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Issue Dt:
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05/31/2005
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Application #:
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10644717
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Filing Dt:
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08/20/2003
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Publication #:
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Pub Dt:
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03/25/2004
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Title:
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ANALYSIS APPARATUS AND ANALYSIS METHOD
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Patent #:
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Issue Dt:
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09/07/2004
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Application #:
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10647944
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Filing Dt:
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08/26/2003
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Publication #:
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Pub Dt:
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02/26/2004
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Title:
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CALORIMETER AND MANUFACTURING METHOD THEREOF
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Patent #:
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Issue Dt:
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10/11/2005
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Application #:
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10651526
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Filing Dt:
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08/29/2003
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Publication #:
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Pub Dt:
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04/22/2004
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Title:
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METHOD OF MANUFACTURING THE MULTI-TIP PROBE, A MULTI-TIP PROBE, AND SURFACE CHARACTERISTIC ANALYSIS APPARATUS
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Patent #:
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Issue Dt:
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09/13/2005
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Application #:
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10663302
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Filing Dt:
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09/16/2003
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Publication #:
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Pub Dt:
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05/20/2004
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Title:
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SCANNING PROBE MICROSCOPE AND OPERATION METHOD
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Patent #:
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Issue Dt:
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10/16/2007
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Application #:
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10692345
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Filing Dt:
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10/23/2003
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Publication #:
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Pub Dt:
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07/01/2004
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Title:
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METHOD OF MANUFACTURING LIGHT-PROPAGATING PROBE FOR NEAR-FIELD MICROSCOPE
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Patent #:
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Issue Dt:
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09/11/2007
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Application #:
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10712147
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Filing Dt:
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11/13/2003
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Publication #:
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Pub Dt:
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07/08/2004
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Title:
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METHOD AND SYSTEM FOR FABRICATING THREE-DIEMENSIONAL MICROSTRUCTURE
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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10721522
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Filing Dt:
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11/24/2003
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Publication #:
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Pub Dt:
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07/08/2004
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Title:
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PHOTOMASK CORRECTION METHOD USING COMPOSITE CHARGED PARTICLE BEAM, AND DEVICE USED IN THE CORRECTION METHOD
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Patent #:
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Issue Dt:
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03/06/2007
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Application #:
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10809555
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Filing Dt:
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03/25/2004
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Publication #:
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Pub Dt:
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10/14/2004
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Title:
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ELECTRICAL PROPERTY EVALUATION APPARATUS
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Patent #:
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Issue Dt:
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08/14/2007
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Application #:
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10823104
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Filing Dt:
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04/13/2004
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Publication #:
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Pub Dt:
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09/30/2004
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Title:
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METHOD AND APPARATUS OF EVALUATING LAYER MATCHING DEVIATION BASED ON CAD INFORMATION
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Patent #:
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Issue Dt:
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08/22/2006
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Application #:
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10828001
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Filing Dt:
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04/20/2004
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Publication #:
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Pub Dt:
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11/18/2004
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Title:
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TEM SAMPLE EQUIPPED WITH AN IDENTIFYING FUNCTION, FOCUSED ION BEAM DEVICE FOR PROCESSING TEM SAMPLE, AND TRANSMISSION ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
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04/11/2006
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Application #:
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10828002
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Filing Dt:
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04/20/2004
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Publication #:
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Pub Dt:
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11/18/2004
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Title:
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SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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06/27/2006
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Application #:
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10839508
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Filing Dt:
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05/05/2004
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Publication #:
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Pub Dt:
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12/09/2004
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Title:
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MICRO-SAMPLE PICK-UP APPARATUS AND MICRO-SAMPLE PICK-UP METHOD
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Patent #:
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Issue Dt:
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02/21/2006
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Application #:
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10854868
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Filing Dt:
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05/27/2004
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Publication #:
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Pub Dt:
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12/09/2004
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Title:
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THIN SPECIMEN PRODUCING METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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03/28/2006
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Application #:
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10867865
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Filing Dt:
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06/15/2004
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Publication #:
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Pub Dt:
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12/15/2005
| | | | |
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Title:
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ELECTRON BEAM PROCESSING METHOD
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Patent #:
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Issue Dt:
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09/27/2005
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Application #:
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10913110
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Filing Dt:
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08/06/2004
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Publication #:
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Pub Dt:
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06/16/2005
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Title:
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VISCOELASTICITY MEASURING INSTRUMENT
|
|
|
|
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Patent #:
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|
Issue Dt:
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05/20/2008
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Application #:
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10925049
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Filing Dt:
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08/24/2004
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Publication #:
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Pub Dt:
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03/10/2005
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Title:
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SCANNING PROBE MICROSCOPE AND SCANNING METHOD
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|
|
|
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Patent #:
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Issue Dt:
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06/26/2007
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Application #:
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10929859
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Filing Dt:
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08/30/2004
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Publication #:
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Pub Dt:
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03/10/2005
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Title:
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COOLING MECHANISM, COOLING APPARATUS HAVING COOLING MECHANISM, AND THERMAL ANALYZER EQUIPPED WITH COOLING APPARATUS
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Patent #:
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Issue Dt:
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06/13/2006
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Application #:
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10935610
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Filing Dt:
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09/07/2004
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Publication #:
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Pub Dt:
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03/10/2005
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Title:
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X-RAY ANALYZER FOR ANALYZING PLASTICS
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|
|
|
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Patent #:
|
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Issue Dt:
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01/13/2009
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Application #:
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10951000
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Filing Dt:
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09/27/2004
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Publication #:
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Pub Dt:
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04/28/2005
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Title:
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METHOD FOR FABRICATING NANOMETER-SCALE STRUCTURE
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Patent #:
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Issue Dt:
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04/15/2008
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Application #:
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10973796
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Filing Dt:
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10/26/2004
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Publication #:
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Pub Dt:
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05/05/2005
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Title:
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MANIPULATOR NEEDLE PORTION REPAIRING METHOD
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Patent #:
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Issue Dt:
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09/12/2006
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Application #:
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10974853
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Filing Dt:
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10/27/2004
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Publication #:
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Pub Dt:
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06/09/2005
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Title:
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THERMAL ANALYZER WITH GAS MIXING CHAMBER
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Patent #:
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Issue Dt:
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10/02/2007
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Application #:
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10990636
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Filing Dt:
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11/17/2004
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Publication #:
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Pub Dt:
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07/28/2005
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Title:
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DIFFERENTIAL SCANNING CALORIMETER WITH A SECOND HEATER
|
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|
|
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Patent #:
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Issue Dt:
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07/10/2007
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Application #:
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11032801
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Filing Dt:
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01/11/2005
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Publication #:
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Pub Dt:
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08/25/2005
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Title:
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SUPERCONDUCTING X-RAY DETECTION APPARATUS AND SUPERCONDUCTING X-RAY ANALYZER USING THE APPARATUS
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|
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Patent #:
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Issue Dt:
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10/30/2007
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Application #:
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11045916
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Filing Dt:
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01/28/2005
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Publication #:
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Pub Dt:
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10/20/2005
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Title:
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FINE-ADJUSTMENT MECHANISM FOR SCANNING PROBE MICROSCOPY
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Patent #:
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Issue Dt:
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06/26/2007
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Application #:
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11048962
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Filing Dt:
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02/02/2005
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Publication #:
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Pub Dt:
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08/04/2005
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Title:
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GAS BLOWING NOZZLE OF CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM APPARATUS AS WELL AS WORKING METHOD
|
|
|
|
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Patent #:
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Issue Dt:
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08/29/2006
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Application #:
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11054504
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Filing Dt:
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02/09/2005
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Publication #:
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Pub Dt:
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09/01/2005
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Title:
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SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF MEASUREMENT BY THE SAME
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Patent #:
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Issue Dt:
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12/26/2006
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Application #:
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11058945
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Filing Dt:
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02/16/2005
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Publication #:
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Pub Dt:
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08/25/2005
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Title:
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FIB-SEM COMPLEX APPARATUS
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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11059434
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Filing Dt:
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02/16/2005
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Publication #:
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Pub Dt:
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08/25/2005
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Title:
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IMAGE NOISE REMOVING METHOD IN FIB/SEM COMPLEX APPARATUS
|
|
|
|
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Patent #:
|
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Issue Dt:
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05/27/2008
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Application #:
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11066063
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Filing Dt:
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02/25/2005
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Publication #:
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Pub Dt:
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09/15/2005
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Title:
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PROCESSING PROBE
|
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|
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Patent #:
|
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Issue Dt:
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10/23/2007
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Application #:
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11076250
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Filing Dt:
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03/09/2005
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Publication #:
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Pub Dt:
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09/15/2005
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Title:
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SCANNING PROBE MICROSCOPE
|
|
|
|
|
Patent #:
|
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Issue Dt:
|
10/23/2007
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Application #:
|
11086812
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Filing Dt:
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03/21/2005
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Publication #:
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Pub Dt:
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09/22/2005
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Title:
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SCRATCH REPAIRING PROCESSING METHOD AND SCANNING PROBE MICROSCOPE (SPM) USED THEREFOR
|
|
|
|
|
Patent #:
|
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Issue Dt:
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08/07/2007
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Application #:
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11088086
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Filing Dt:
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03/23/2005
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Publication #:
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Pub Dt:
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09/29/2005
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Title:
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SCANNING PROBE MICROSCOPE AND MEASURING METHOD BY MEANS OF THE SAME
|
|
|
|
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Patent #:
|
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Issue Dt:
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09/19/2006
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Application #:
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11096875
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Filing Dt:
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04/01/2005
|
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Publication #:
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Pub Dt:
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10/13/2005
| | | | |
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Title:
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SCANNING PROBE DEVICE AND PROCESSING METHOD BY SCANNING PROBE
|
|
|
|
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Patent #:
|
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Issue Dt:
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05/20/2008
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Application #:
|
11137843
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Filing Dt:
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05/25/2005
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Publication #:
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Pub Dt:
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12/29/2005
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Title:
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PHOTOMASK DEFECT CORRECTION METHOD EMPLOYING A COMBINED DEVICE OF A FOCUSED ELECTRON BEAM DEVICE AND AN ATOMIC FORCE MICROSCOPE
|
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Patent #:
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Issue Dt:
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07/10/2007
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Application #:
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11196104
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Filing Dt:
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08/03/2005
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Publication #:
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Pub Dt:
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03/02/2006
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Title:
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PROBE FOR NEAR-FIELD MICROSCOPE, THE METHOD FOR MANUFACTURING THE PROBE AND SCANNING PROBE MICROSCOPE USING THE PROBE
|
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Patent #:
|
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Issue Dt:
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01/30/2007
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Application #:
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11199290
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Filing Dt:
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08/08/2005
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Publication #:
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Pub Dt:
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03/02/2006
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Title:
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SCANNING PROBE MICROSCOPY CANTILEVER HOLDER AND SCANNING PROBE MICROSCOPE USING THE CANTILEVER HOLDER
|
|
|
|
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Patent #:
|
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Issue Dt:
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03/31/2009
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Application #:
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11208830
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Filing Dt:
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08/22/2005
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Publication #:
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Pub Dt:
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03/02/2006
| | | | |
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Title:
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METHOD OF APPROACHING PROBE AND APPARATUS FOR REALIZING THE SAME
|
|
|
|
|
Patent #:
|
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Issue Dt:
|
03/24/2009
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Application #:
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11216389
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Filing Dt:
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08/31/2005
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Publication #:
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Pub Dt:
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03/23/2006
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Title:
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PROBE MICROSCOPE SYSTEM SUITABLE FOR OBSERVING SAMPLE OF LONG BODY
|
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|
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Patent #:
|
|
Issue Dt:
|
10/28/2008
|
Application #:
|
11230903
|
Filing Dt:
|
09/20/2005
|
|
Publication #:
|
|
Pub Dt:
|
04/20/2006
| | | | |
|
Title:
|
SURFACE INFORMATION MEASURING APPARATUS AND SURFACE INFORMATION MEASURING METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/04/2008
|
Application #:
|
11230904
|
Filing Dt:
|
09/20/2005
|
|
Publication #:
|
|
Pub Dt:
|
01/19/2006
| | | | |
|
Title:
|
SURFACE CHARACTERISTIC ANALYSIS APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/29/2009
|
Application #:
|
11313326
|
Filing Dt:
|
12/21/2005
|
|
Publication #:
|
|
Pub Dt:
|
06/29/2006
| | | | |
|
Title:
|
METHOD AND APPARATUS FOR SPECIFYING WORKING POSITION ON A SAMPLE AND METHOD OF WORKING THE SAMPLE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/15/2010
|
Application #:
|
11353603
|
Filing Dt:
|
02/14/2006
|
|
Publication #:
|
|
Pub Dt:
|
08/24/2006
| | | | |
|
Title:
|
NANOBIO DEVICE OF IMITATIVE ANATOMY STRUCTURE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/18/2008
|
Application #:
|
11356698
|
Filing Dt:
|
02/17/2006
|
|
Publication #:
|
|
Pub Dt:
|
08/24/2006
| | | | |
|
Title:
|
SAMPLE SUPPORT PREPARED BY SEMICONDUCTOR SILICON PROCESS TECHNIQUE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/09/2008
|
Application #:
|
11360948
|
Filing Dt:
|
02/23/2006
|
|
Publication #:
|
|
Pub Dt:
|
08/31/2006
| | | | |
|
Title:
|
SAMPLE HEIGHT REGULATING METHOD, SAMPLE OBSERVING METHOD, SAMPLE PROCESSING METHOD AND CHARGED PARTICLE BEAM APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/28/2008
|
Application #:
|
11370006
|
Filing Dt:
|
03/04/2006
|
|
Publication #:
|
|
Pub Dt:
|
10/05/2006
| | | | |
|
Title:
|
WORKING METHOD USING SCANNING PROBE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/20/2008
|
Application #:
|
11374841
|
Filing Dt:
|
03/14/2006
|
|
Publication #:
|
|
Pub Dt:
|
10/05/2006
| | | | |
|
Title:
|
CANTILEVER HOLDER AND SCANNING PROBE MICROSCOPE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/30/2007
|
Application #:
|
11389447
|
Filing Dt:
|
03/24/2006
|
|
Publication #:
|
|
Pub Dt:
|
10/12/2006
| | | | |
|
Title:
|
OPTICAL AXIS ADJUSTING MECHANISM FOR X-RAY LENS, X-RAY ANALYTICAL INSTRUMENT, AND METHOD OF ADJUSTING OPTICAL AXIS OF X-RAY LENS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/14/2009
|
Application #:
|
11501629
|
Filing Dt:
|
08/09/2006
|
|
Publication #:
|
|
Pub Dt:
|
02/22/2007
| | | | |
|
Title:
|
PROCESSING APPARATUS USING FOCUSED CHARGED PARTICLE BEAM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/28/2008
|
Application #:
|
11509520
|
Filing Dt:
|
08/24/2006
|
|
Publication #:
|
|
Pub Dt:
|
03/01/2007
| | | | |
|
Title:
|
CHARGED PARTICLE BEAM APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/20/2009
|
Application #:
|
11595184
|
Filing Dt:
|
11/09/2006
|
|
Publication #:
|
|
Pub Dt:
|
05/10/2007
| | | | |
|
Title:
|
VIBRATION-TYPE CANTILEVER HOLDER AND SCANNING PROBE MICROSCOPE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/06/2010
|
Application #:
|
11661638
|
Filing Dt:
|
04/26/2007
|
|
Publication #:
|
|
Pub Dt:
|
01/31/2008
| | | | |
|
Title:
|
THERMAL ANALYSIS EQUIPMENT
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/15/2009
|
Application #:
|
11794288
|
Filing Dt:
|
08/02/2007
|
|
Publication #:
|
|
Pub Dt:
|
12/20/2007
| | | | |
|
Title:
|
SUPERCONDUCTING X-RAY DETECTOR AND X-RAY ANALYSIS APPARATUS USING THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/31/2009
|
Application #:
|
11799973
|
Filing Dt:
|
05/03/2007
|
|
Publication #:
|
|
Pub Dt:
|
09/06/2007
| | | | |
|
Title:
|
WORKING METHOD UTILIZING IRRADIATION OF CHARGED PARTICLE BEAM ONTO SAMPLE THROUGH PASSAGE IN GAS BLOWING NOZZLE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/07/2010
|
Application #:
|
11810767
|
Filing Dt:
|
06/07/2007
|
|
Publication #:
|
|
Pub Dt:
|
01/28/2010
| | | | |
|
Title:
|
SUPERCONDUCTING RADIOMETRY APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/23/2008
|
Application #:
|
11827110
|
Filing Dt:
|
07/10/2007
|
|
Publication #:
|
|
Pub Dt:
|
01/31/2008
| | | | |
|
Title:
|
PIEZOELECTRIC ACTUATOR AND SCANNING PROBE MICROSCOPE USING THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/16/2011
|
Application #:
|
11879878
|
Filing Dt:
|
07/19/2007
|
|
Publication #:
|
|
Pub Dt:
|
12/20/2007
| | | | |
|
Title:
|
SCANNING PROBE MICROSCOPE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/06/2010
|
Application #:
|
11918171
|
Filing Dt:
|
11/26/2007
|
|
Publication #:
|
|
Pub Dt:
|
12/11/2008
| | | | |
|
Title:
|
WORKING METHOD BY FOCUSED ION BEAM AND FOCUSED ION BEAM WORKING APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/12/2012
|
Application #:
|
12290397
|
Filing Dt:
|
10/29/2008
|
|
Publication #:
|
|
Pub Dt:
|
05/07/2009
| | | | |
|
Title:
|
SAMPLE PREPARING DEVICE AND SAMPLE POSTURE SHIFTING METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/28/2012
|
Application #:
|
12310149
|
Filing Dt:
|
04/24/2009
|
|
Publication #:
|
|
Pub Dt:
|
10/01/2009
| | | | |
|
Title:
|
CHARGED PARTICLE BEAM APPARATUS AND METHOD ADJUSTING AXIS OF APERTURE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/05/2011
|
Application #:
|
12378138
|
Filing Dt:
|
02/11/2009
|
|
Publication #:
|
|
Pub Dt:
|
08/20/2009
| | | | |
|
Title:
|
COMPOSITE CHARGED PARTICLE BEAM APPARATUS, METHOD OF PROCESSING A SAMPLE AND METHOD OF PREPARING A SAMPLE FOR A TRANSMISSION ELECTRON MICROSCOPE USING THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/15/2011
|
Application #:
|
12378139
|
Filing Dt:
|
02/11/2009
|
|
Publication #:
|
|
Pub Dt:
|
08/20/2009
| | | | |
|
Title:
|
CIRCULAR CYLINDER TYPE PIEZOELECTRIC ACTUATOR AND PIEZOELECTRIC ELEMENT AND SCANNING PROBE MICROSCOPE USING THOSE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/07/2012
|
Application #:
|
12378181
|
Filing Dt:
|
02/11/2009
|
|
Publication #:
|
|
Pub Dt:
|
08/20/2009
| | | | |
|
Title:
|
CONDUCTIVITY MEASURING APPARATUS AND CONDUCTIVITY MEASURING METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/20/2013
|
Application #:
|
12378186
|
Filing Dt:
|
02/11/2009
|
|
Publication #:
|
|
Pub Dt:
|
08/27/2009
| | | | |
|
Title:
|
CHARGED PARTICLE BEAM APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/06/2012
|
Application #:
|
12380432
|
Filing Dt:
|
02/27/2009
|
|
Publication #:
|
|
Pub Dt:
|
01/14/2010
| | | | |
|
Title:
|
SECTION PROCESSING METHOD AND ITS APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/19/2011
|
Application #:
|
12380872
|
Filing Dt:
|
03/03/2009
|
|
Publication #:
|
|
Pub Dt:
|
09/10/2009
| | | | |
|
Title:
|
METHOD FOR FABRICATING EUVL MASK
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/15/2014
|
Application #:
|
12449633
|
Filing Dt:
|
09/18/2009
|
|
Publication #:
|
|
Pub Dt:
|
05/13/2010
| | | | |
|
Title:
|
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF ADJUSTING CHARGED PARTICLE OPTICS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/03/2012
|
Application #:
|
12455556
|
Filing Dt:
|
06/03/2009
|
|
Publication #:
|
|
Pub Dt:
|
04/29/2010
| | | | |
|
Title:
|
CANTILEVER, CANTILEVER SYSTEM, SCANNING PROBE MICROSCOPE, MASS SENSOR APPARATUS, VISCOELASTICITY MEASURING INSTRUMENT, MANIPULATION APPARATUS, DISPLACEMENT DETERMINATION METHOD OF CANTILEVER, VIBRATION METHOD OF CANTILEVER AND DEFORMATION METHOD OF CANTILEVER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/17/2012
|
Application #:
|
12592428
|
Filing Dt:
|
11/24/2009
|
|
Publication #:
|
|
Pub Dt:
|
05/27/2010
| | | | |
|
Title:
|
SELF DISPLACEMENT SENSING CANTILEVER AND SCANNING PROBE MICROSCOPE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/01/2013
|
Application #:
|
12658828
|
Filing Dt:
|
02/16/2010
|
|
Publication #:
|
|
Pub Dt:
|
09/02/2010
| | | | |
|
Title:
|
DIFFERENTIAL SCANNING CALORIMETER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/18/2012
|
Application #:
|
12733089
|
Filing Dt:
|
03/19/2010
|
|
Publication #:
|
|
Pub Dt:
|
07/15/2010
| | | | |
|
Title:
|
COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHOD AND PROCESSING METHOD USING THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/04/2012
|
Application #:
|
12733090
|
Filing Dt:
|
03/19/2010
|
|
Publication #:
|
|
Pub Dt:
|
07/15/2010
| | | | |
|
Title:
|
PHOTOMASK DEFECT CORRECTING METHOD AND DEVICE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/25/2012
|
Application #:
|
12733091
|
Filing Dt:
|
03/19/2010
|
|
Publication #:
|
|
Pub Dt:
|
11/18/2010
| | | | |
|
Title:
|
COMPOSITE FOCUSED ION BEAM DEVICE, PROCESS OBSERVATION METHOD USING THE SAME,AND PROCESSING METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/16/2013
|
Application #:
|
12802401
|
Filing Dt:
|
06/07/2010
|
|
Publication #:
|
|
Pub Dt:
|
12/16/2010
| | | | |
|
Title:
|
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
12/17/2013
|
Application #:
|
12806364
|
Filing Dt:
|
08/11/2010
|
|
Publication #:
|
|
Pub Dt:
|
02/17/2011
| | | | |
|
Title:
|
SOFTENING POINT MEASURING APPARATUS AND THERMAL CONDUCTIVITY MEASURING APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/22/2013
|
Application #:
|
12806997
|
Filing Dt:
|
08/25/2010
|
|
Publication #:
|
|
Pub Dt:
|
03/03/2011
| | | | |
|
Title:
|
THERMAL ANALYSIS APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/04/2014
|
Application #:
|
12931411
|
Filing Dt:
|
01/28/2011
|
|
Publication #:
|
|
Pub Dt:
|
08/04/2011
| | | | |
|
Title:
|
ELECTRON MICROSCOPE AND SPECIMEN ANALYZING METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/11/2013
|
Application #:
|
12931412
|
Filing Dt:
|
01/28/2011
|
|
Publication #:
|
|
Pub Dt:
|
08/04/2011
| | | | |
|
Title:
|
DEFECT REPAIR APPARATUS AND METHOD FOR EUV MASK USING A HYDROGEN ION BEAM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/05/2013
|
Application #:
|
12931993
|
Filing Dt:
|
02/15/2011
|
|
Publication #:
|
|
Pub Dt:
|
08/25/2011
| | | | |
|
Title:
|
Focused ion beam apparatus
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
12/03/2013
|
Application #:
|
12932122
|
Filing Dt:
|
02/17/2011
|
|
Publication #:
|
|
Pub Dt:
|
09/15/2011
| | | | |
|
Title:
|
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSPECTION METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/04/2014
|
Application #:
|
13065237
|
Filing Dt:
|
03/17/2011
|
|
Publication #:
|
|
Pub Dt:
|
09/22/2011
| | | | |
|
Title:
|
Composite charged particle beam apparatus and sample processing and observing method
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/25/2012
|
Application #:
|
13065238
|
Filing Dt:
|
03/17/2011
|
|
Publication #:
|
|
Pub Dt:
|
09/22/2011
| | | | |
|
Title:
|
SAMPLE PROCESSING AND OBSERVING METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/29/2014
|
Application #:
|
13065687
|
Filing Dt:
|
03/28/2011
|
|
Publication #:
|
|
Pub Dt:
|
09/29/2011
| | | | |
|
Title:
|
Thermal analyzer
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/02/2014
|
Application #:
|
13065698
|
Filing Dt:
|
03/28/2011
|
|
Publication #:
|
|
Pub Dt:
|
09/29/2011
| | | | |
|
Title:
|
Focused ion beam apparatus
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/18/2012
|
Application #:
|
13135300
|
Filing Dt:
|
06/30/2011
|
|
Publication #:
|
|
Pub Dt:
|
01/05/2012
| | | | |
|
Title:
|
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING METHOD
|
|
