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Reel/Frame:017519/0082   Pages: 10
Recorded: 04/24/2006
Attorney Dkt #:60148-0010
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 33
1
Patent #:
5521518
Issue Dt:
05/28/1996
Application #:
07775914
Filing Dt:
10/15/1991
Title:
PROBE CARD APPARATUS
2
Patent #:
5180977
Issue Dt:
01/19/1993
Application #:
07801702
Filing Dt:
12/02/1991
Title:
MEMBRANE PROBE CONTACT BUMP COMPLIANCY SYSTEM
3
Patent #:
5382898
Issue Dt:
01/17/1995
Application #:
07947935
Filing Dt:
09/21/1992
Title:
HIGH DENSITY PROBE CARD FOR TESTING ELECTRICAL CIRCUITS
4
Patent #:
5402077
Issue Dt:
03/28/1995
Application #:
07979719
Filing Dt:
11/20/1992
Title:
BARE DIE CARRIER
5
Patent #:
5422574
Issue Dt:
06/06/1995
Application #:
08004447
Filing Dt:
01/14/1993
Title:
LARGE SCALE PROTRUSION MEMBRANE FOR SEMICONDUCTOR DEVICES UNDER TEST WITH VERY HIGH PIN COUNTS
6
Patent #:
5720098
Issue Dt:
02/24/1998
Application #:
08440521
Filing Dt:
05/12/1995
Title:
METHOD FOR MAKING A PROBE PRESERVING A UNIFORM STRESS DISTRIBUTION UNDER DEFLECTION
7
Patent #:
6049215
Issue Dt:
04/11/2000
Application #:
08542685
Filing Dt:
10/13/1995
Title:
BARE DIE CARRIER
8
Patent #:
5742174
Issue Dt:
04/21/1998
Application #:
08553069
Filing Dt:
11/03/1995
Title:
MEMBRANE FOR HOLDING A PROBE TIP IN PROPER LOCATION
9
Patent #:
5876580
Issue Dt:
03/02/1999
Application #:
08586232
Filing Dt:
01/12/1996
Title:
ROUGH ELECTRICAL CONTACT SURFACE
10
Patent #:
6037785
Issue Dt:
03/14/2000
Application #:
08652942
Filing Dt:
05/24/1996
Title:
PROBE CARD APPARATUS
11
Patent #:
5644249
Issue Dt:
07/01/1997
Application #:
08659861
Filing Dt:
06/07/1996
Title:
METHOD AND CIRCUIT TESTING APPARATUS FOR EQUALIZING A CONTACT FORCE BETWEEN PROBES AND PADS
12
Patent #:
5847571
Issue Dt:
12/08/1998
Application #:
08675416
Filing Dt:
07/03/1996
Title:
MEMBRANE PROBING OF CIRCUITS
13
Patent #:
5751157
Issue Dt:
05/12/1998
Application #:
08681226
Filing Dt:
07/22/1996
Title:
METHOD AND APPARATUS FOR ALIGNING PROBES
14
Patent #:
5828226
Issue Dt:
10/27/1998
Application #:
08746117
Filing Dt:
11/06/1996
Title:
PROBE CARD ASSEMBLY FOR HIGH DENSITY INTEGRATED CIRCUITS
15
Patent #:
5841291
Issue Dt:
11/24/1998
Application #:
08764511
Filing Dt:
12/12/1996
Title:
EXCHANGEABLE MEMBRANE PROBE TESTING OF CIRCUITS
16
Patent #:
5764072
Issue Dt:
06/09/1998
Application #:
08771274
Filing Dt:
12/20/1996
Title:
DUAL CONTACT PROBE ASSEMBLY FOR TESTING INTEGRATED CIRCUITS
17
Patent #:
5884395
Issue Dt:
03/23/1999
Application #:
08835078
Filing Dt:
04/04/1997
Title:
ASSEMBLY STRUCTURE FOR MAKING INTEGRATED CIRCUIT CHIP PROBE CARDS
18
Patent #:
5923178
Issue Dt:
07/13/1999
Application #:
08837399
Filing Dt:
04/17/1997
Title:
PROBE ASSEMBLY AND METHOD FOR SWITCHABLE MULTI-DUT TESTING OF INTEGRATED CIRCUIT WAFERS
19
Patent #:
5973504
Issue Dt:
10/26/1999
Application #:
08925369
Filing Dt:
09/08/1997
Title:
PROGRAMMABLE HIGH-DENSITY ELECTRONIC DEVICE TESTING
20
Patent #:
6204674
Issue Dt:
03/20/2001
Application #:
08962595
Filing Dt:
10/31/1997
Title:
ASSEMBLY STRUCTURE FOR MAKING INTEGRATED CIRCUIT CHIP PROBE CARDS
21
Patent #:
6064215
Issue Dt:
05/16/2000
Application #:
09057080
Filing Dt:
04/08/1998
Title:
HIGH TEMPERATURE PROBE CARD FOR TESTING INTEGRATED CIRCUITS
22
Patent #:
6114869
Issue Dt:
09/05/2000
Application #:
09082896
Filing Dt:
05/21/1998
Title:
METHOD AND APPARATUS FOR INTERFACING BETWEEN AUTOMATIC WAFER PROBE MACHINES, AUTOMATIC TESTERS, AND PROBE CARDS
23
Patent #:
6419500
Issue Dt:
07/16/2002
Application #:
09264599
Filing Dt:
03/08/1999
Title:
METHOD FOR MAKING A PROBE APPARATUS FOR TESTING INTEGRATED CIRCUITS
24
Patent #:
6937044
Issue Dt:
08/30/2005
Application #:
09534729
Filing Dt:
03/24/2000
Title:
BARE DIE CARRIER
25
Patent #:
6530148
Issue Dt:
03/11/2003
Application #:
09579718
Filing Dt:
05/26/2000
Title:
METHOD FOR MAKING A PROBE APPARATUS FOR TESTING INTEGRATED CIRCUITS
26
Patent #:
6424164
Issue Dt:
07/23/2002
Application #:
09593262
Filing Dt:
06/13/2000
Title:
PROBE APPARATUS HAVING REMOVABLE BEAM PROBES
27
Patent #:
6420887
Issue Dt:
07/16/2002
Application #:
09593314
Filing Dt:
06/13/2000
Title:
MODULATED SPACE TRANSFORMER FOR HIGH DENSITY BUCKLING BEAM PROBE AND METHOD FOR MAKING THE SAME
28
Patent #:
6570396
Issue Dt:
05/27/2003
Application #:
09721910
Filing Dt:
11/24/2000
Title:
INTERFACE STRUCTURE FOR CONTACTING PROBE BEAMS
29
Patent #:
6525552
Issue Dt:
02/25/2003
Application #:
09854152
Filing Dt:
05/11/2001
Publication #:
US20020167328
Pub Dt:
11/14/2002
Title:
MODULAR PROBE APPARATUS
30
Patent #:
6908364
Issue Dt:
06/21/2005
Application #:
09921327
Filing Dt:
08/02/2001
Publication #:
US20030027496
Pub Dt:
02/06/2003
Title:
METHOD AND APPARATUS FOR PROBE TIP CLEANING AND SHAPING PAD
31
Patent #:
6965245
Issue Dt:
11/15/2005
Application #:
10429275
Filing Dt:
05/01/2003
Publication #:
US20040217768
Pub Dt:
11/04/2004
Title:
PREFABRICATED AND ATTACHED INTERCONNECT STRUCTURE
32
Patent #:
D510043
Issue Dt:
09/27/2005
Application #:
29183540
Filing Dt:
06/11/2003
Title:
CONTINUOUSLY PROFILED PROBE BEAM
33
Patent #:
D507198
Issue Dt:
07/12/2005
Application #:
29190399
Filing Dt:
09/19/2003
Title:
STRAIGHT PROTRUDING PROBE BEAM CONTOUR SURFACES
Assignors
1
KULICKE AND SOFFA INDUSTRIES, INC.
Exec Dt:
03/03/2006
2
K&S INTERCONNECT, INC.
Exec Dt:
03/03/2006
Assignee
1
SV PROBE PTE LTD.
29 WOODLANDS INDUSTRIAL PARK E1
#04-01, NORTH TECH, LOBBY 1
SINGAPORE, SINGAPORE 757716
Correspondence name and address
EDWARD A. BECKER
2055 GATEWAY PLACE, SUITE 550
SAN JOSE, CA 95110-1089

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