Patent Assignment Details
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Reel/Frame: | 016729/0088 | |
| Pages: | 2 |
| | Recorded: | 06/24/2005 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/06/2008
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Application #:
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11165711
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Filing Dt:
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06/24/2005
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Title:
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METHOD AND SYSTEM FOR MEASURING DEEP TRENCHES IN SILICON
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Assignee
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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JOHN M. KUBODERA, ESQ.
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BEVER, HOFFMAN & HARMS, LLP
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2099 GATEWAY PLACE, SUITE 320
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SAN JOSE, CA 95110
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