Patent Assignment Details
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Reel/Frame: | 059171/0116 | |
| Pages: | 6 |
| | Recorded: | 02/17/2022 | | |
Attorney Dkt #: | P118007US |
Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE ADD THE 4TH INVENTOR PREVIOUSLY RECORDED AT REEL: 052745 FRAME: 0648. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/31/2022
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Application #:
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16881025
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Filing Dt:
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05/22/2020
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Publication #:
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Pub Dt:
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11/25/2021
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Title:
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METHOD, DEVICE AND SYSTEM FOR NON-DESTRUCTIVE DETECTION OF DEFECTS IN A SEMICONDUCTOR DIE
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Assignee
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2200 MISSION COLLEGE BLVD |
SANTA CLARA, CALIFORNIA 95054 |
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Correspondence name and address
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VIERING, JENTSCHURA & PARTNER MBB
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C/O 444 BRICKELL AVENUE
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SUITE 700
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MIAMI, FL 33131
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