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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:016290/0172   Pages: 2
Recorded: 06/01/2005
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 7
1
Patent #:
Issue Dt:
10/12/1999
Application #:
08807789
Filing Dt:
02/28/1997
Title:
HIGH ACCURACY PARTICLE DIMENSION MEASUREMENT SYSTEM
2
Patent #:
Issue Dt:
07/17/2001
Application #:
09028207
Filing Dt:
02/23/1998
Title:
HIGH ACCURACY PARTICLE DIMENSION MEASUREMENT SYSTEM
3
Patent #:
Issue Dt:
12/26/2000
Application #:
09342526
Filing Dt:
06/29/1999
Title:
HIGH ACCURACY PARTICLE DIMENSION MEASUREMENT SYSTEM
4
Patent #:
Issue Dt:
06/11/2002
Application #:
09606841
Filing Dt:
06/28/2000
Title:
MICROSCOPIC FEATURE OPACITY MEASUREMENT SYSTEM
5
Patent #:
Issue Dt:
03/25/2003
Application #:
09657920
Filing Dt:
09/08/2000
Title:
MICROSCOPIC FEATURE DIMENSION MEASUREMENT SYSTEM
6
Patent #:
Issue Dt:
07/06/2004
Application #:
09685973
Filing Dt:
10/10/2000
Title:
OPTICAL PROXIMITY CORRECTION SERIF MEASUREMENT TECHNIQUE
7
Patent #:
Issue Dt:
05/28/2002
Application #:
09877647
Filing Dt:
06/07/2001
Title:
MICROSCOPIC CORNER RADIUS MEASUREMENT SYSTEM
Assignor
1
Exec Dt:
05/25/2004
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
BEYER WEAVER & THOMAS LLP
P.O. BOX 70250
OAKLAND, CA 94612-0250

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