|
Total properties:
18
|
|
|
|
Patent #:
|
|
Issue Dt:
|
06/15/1993
|
Application #:
|
07702983
|
Filing Dt:
|
05/20/1991
|
|
Title:
|
LEAD CONDITIONER FOR QUAD SEMICONDUCTOR PACKAGES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/09/1995
|
Application #:
|
08043333
|
Filing Dt:
|
04/06/1993
|
|
Title:
|
SEMICONDUCTOR DEVICE LEAD INSPECTION SYSTEM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/28/1995
|
Application #:
|
08138791
|
Filing Dt:
|
10/18/1993
|
|
Title:
|
SEMICONDUCTOR DEVICE LEAD INSPECTION SYSTEM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/03/2000
|
Application #:
|
08200616
|
Filing Dt:
|
02/18/1994
|
|
Title:
|
HIGH SPEED LEAD INSPECTION SYSTEM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/07/1998
|
Application #:
|
08275162
|
Filing Dt:
|
07/14/1994
|
|
Title:
|
PROGRAMMABLE LEAD CONDITIONER
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/28/1998
|
Application #:
|
08686296
|
Filing Dt:
|
07/25/1996
|
|
Title:
|
METHOD AND SYSTEM FOR INSPECTING INTEGRATED CIRCUIT LEAD BURRS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/17/1998
|
Application #:
|
08777843
|
Filing Dt:
|
12/26/1996
|
|
Title:
|
SEMICONDUCTOR DEVICE LEAD CALIBRATION UNIT
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/12/2000
|
Application #:
|
08890814
|
Filing Dt:
|
07/11/1997
|
|
Title:
|
METHOD AND APPARATUS FOR INSPECTING A WORKPIECE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/27/1998
|
Application #:
|
08936860
|
Filing Dt:
|
09/24/1997
|
|
Title:
|
J-LEAD CONDITIONING METHOD AND APPARATUS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/21/1999
|
Application #:
|
09069056
|
Filing Dt:
|
04/28/1998
|
|
Title:
|
INSPECTION SYSTEM AND METHOD FOR LEADS OF SEMICONDUCTOR DEVICES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/16/2001
|
Application #:
|
09197996
|
Filing Dt:
|
11/23/1998
|
|
Title:
|
SINGLE STATION CUTTING APPARATUS FOR SEPARATING SEMICONDUCTOR PACKAGES
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/28/2000
|
Application #:
|
09301396
|
Filing Dt:
|
04/28/1999
|
|
Title:
|
SYSTEM AND METHOD FOR TRANSFERRING COMPONENTS BETWEEN PACKING MEDIA
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
04/02/2002
|
Application #:
|
09418056
|
Filing Dt:
|
10/14/1999
|
|
Title:
|
3D PROFILE ANALYSIS FOR SURFACE CONTOUR INSPECTION
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/10/2001
|
Application #:
|
09429824
|
Filing Dt:
|
10/29/1999
|
|
Title:
|
POST-SEAL INSPECTION SYSTEM AND METHOD
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/30/2001
|
Application #:
|
09495830
|
Filing Dt:
|
02/01/2000
|
|
Title:
|
Single station cutting apparatus for separating semiconductor packages
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/20/2003
|
Application #:
|
09723985
|
Filing Dt:
|
11/28/2000
|
|
Title:
|
THREE DIMENSIONAL LEAD INSPECTION SYSTEM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/03/2002
|
Application #:
|
09723986
|
Filing Dt:
|
11/28/2000
|
|
Title:
|
THREE DIMENSIONAL LEAD INSPECTION SYSTEM
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/28/2002
|
Application #:
|
09814022
|
Filing Dt:
|
03/21/2001
|
|
Publication #:
|
|
Pub Dt:
|
10/11/2001
| | | | |
|
Title:
|
POST-SEAL INSPECTION SYSTEM AND METHOD
|
|
