Patent Assignment Details
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| Reel/Frame: | 046122/0220 | |
| Pages: | 5 |
| | Recorded: | 06/18/2018 | | |
| Attorney Dkt #: | KLATP020/P5094 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/16/2019
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Application #:
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15683631
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Filing Dt:
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08/22/2017
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Publication #:
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Pub Dt:
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10/18/2018
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Title:
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SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR SYSTEMATIC AND STOCHASTIC CHARACTERIZATION OF PATTERN DEFECTS IDENTIFIED FROM A SEMICONDUCTOR WAFER
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Assignee
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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ZILKA-KOTAB, PC
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1155 N. 1ST ST.
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SUITE 105
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SAN JOSE, CA 95112
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