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Reel/Frame:018848/0221   Pages: 22
Recorded: 02/02/2007
Attorney Dkt #:56197200-279
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11465888
Filing Dt:
08/21/2006
Publication #:
Pub Dt:
05/17/2007
Title:
Test Pads, Methods and Systems for Measuring Properties of a Wafer
Assignors
1
Exec Dt:
11/01/2006
2
Exec Dt:
11/10/2006
3
Exec Dt:
09/18/2006
4
Exec Dt:
01/08/2007
5
Exec Dt:
01/08/2007
6
Exec Dt:
11/20/2006
7
Exec Dt:
11/14/2006
8
Exec Dt:
11/27/2006
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
BAKER & MCKENZIE LLP
1114 AVENUE OF THE AMERICAS
NEW YORK, NY 10036

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