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Patent Assignment Details
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Reel/Frame:012371/0234   Pages: 4
Recorded: 10/31/2001
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
01/27/2004
Application #:
10007417
Filing Dt:
10/31/2001
Publication #:
Pub Dt:
05/01/2003
Title:
INTEGRATED CIRCUIT HAVING STRESS MIGRATION TEST STRUCTURE AND METHOD THEREFOR
Assignors
1
Exec Dt:
10/30/2001
2
Exec Dt:
10/30/2001
Assignee
1
555 UNION BOULEVARD
ALLENTOWN, PENNSYLVANIA 18109
Correspondence name and address
AGERE SYSTEMS INC.
DAVID L. SMITH
P.O. BOX 614, ROOM 3C-512
BERKELEY HEIGHTS, NJ 07922-0614

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