Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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Reel/Frame: | 017366/0240 | |
| Pages: | 12 |
| | Recorded: | 03/27/2006 | | |
Attorney Dkt #: | 816861.2 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
10
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Patent #:
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Issue Dt:
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12/14/2004
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Application #:
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10194526
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Filing Dt:
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07/12/2002
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Publication #:
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Pub Dt:
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01/15/2004
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Title:
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WAFER PROBE FOR MEASURING PLASMA AND SURFACE CHARACTERISTICS IN PLASMA PROCESSING ENVIROMENTS
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Patent #:
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Issue Dt:
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06/07/2005
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Application #:
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10640892
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Filing Dt:
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08/14/2003
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Publication #:
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Pub Dt:
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02/17/2005
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Title:
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SENSOR ARRAY FOR MEASURING PLASMA CHARACTERISTICS IN PLASMA PROCESSING ENVIRONMENTS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10815124
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Filing Dt:
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03/31/2004
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Publication #:
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Pub Dt:
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10/06/2005
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Title:
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Techniques for packaging and encapsulating components of diagnostic plasma measurement devices
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10875954
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Filing Dt:
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06/24/2004
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Publication #:
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Pub Dt:
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12/29/2005
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Title:
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Diagnostic plasma measurement device having patterned sensors and features
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10920138
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Filing Dt:
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08/17/2004
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Publication #:
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Pub Dt:
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01/20/2005
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Title:
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Wafer probe for measuring plasma and surface characteristics in plasma processing environments
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10933167
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Filing Dt:
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09/02/2004
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Publication #:
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Pub Dt:
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03/02/2006
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Title:
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Electrically floating diagnostic plasma probe with ion property sensors
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10951084
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Filing Dt:
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09/27/2004
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Publication #:
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Pub Dt:
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02/24/2005
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Title:
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Wafer probe for measuring plasma and surface characteristics in plasma processing enviroments
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Patent #:
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Issue Dt:
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03/20/2007
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Application #:
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10951162
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Filing Dt:
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09/27/2004
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Publication #:
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Pub Dt:
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02/17/2005
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Title:
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WAFER PROBE FOR MEASURING PLASMA AND SURFACE CHARACTERISTICS IN PLASMA PROCESSING ENVIRONMENTS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11047256
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Filing Dt:
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01/31/2005
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Publication #:
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Pub Dt:
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08/03/2006
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Title:
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Diagnostic plasma sensors for endpoint and end-of-life detection
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Patent #:
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Issue Dt:
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10/01/2013
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Application #:
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11066520
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Filing Dt:
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02/25/2005
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Publication #:
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Pub Dt:
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07/14/2005
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Title:
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SENSOR ARRAY FOR MEASURING PLASMA CHARACTERISTICS IN PLASMA PROCESSING ENVIRONMENTS
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Assignee
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1625 SHARP POINT DRIVE |
FORT COLLINS, COLORADO 80525 |
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Correspondence name and address
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JOSEPH R. TIANO, JR.
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701 EIGHTH STREET, N.W.
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WASHINGTON, DC 20001
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