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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	016536/0245			Pages:	4
		Recorded:	07/16/2005
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 23

Patent #:	6031615	Issue Dt:	02/29/2000	Application #:	09136897	Filing Dt:	08/19/1998
Title:	SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING LUBRICANT THICKNESS AND DEGRADATION, THIN FILM THICKNESS AND WEAR, AND SURFACE ROUGHNESS

Patent #:	6717671	Issue Dt:	04/06/2004	Application #:	09347622	Filing Dt:	07/02/1999
Title:	SYSTEM FOR SIMULTANEOUSLY MEASURING THIN FILM LAYER THICKNESS, REFLECTIVITY, ROUGHNESS, SURFACE PROFILE AND MAGNETIC PATTERN

Patent #:	6268919	Issue Dt:	07/31/2001	Application #:	09376151	Filing Dt:	08/17/1999
Title:	SYSTEM AND METHOD FOR MEASURING THIN FILM PROPERTIES AND ANALYZING TWO-DIMENSIONAL HISTOGRAMS USING AND/NOT OPERATIONS

Patent #:	6130749	Issue Dt:	10/10/2000	Application #:	09376152	Filing Dt:	08/17/1999
Title:	SYSTEM AND METHOD FOR MEASURING THIN FILM PROPERTIES AND ANALYZING TWO-DIMENSIONAL HISTOGRAMS USING A SYMMETRY OPERATION

Patent #:	6229610	Issue Dt:	05/08/2001	Application #:	09376705	Filing Dt:	08/17/1999
Title:	SYSTEM AND METHOD FOR MEASURING THIN FILM PROPERTIES AND ANALYZING TWO-DIMENSIONAL HISTOGRAMS USING SUBSTRACTION OPERATION

Patent #:	6198533	Issue Dt:	03/06/2001	Application #:	09376711	Filing Dt:	08/17/1999
Title:	HIGH TEMPERATURE THIN FILM PROPERTY MEASUREMENT SYSTEM AND METHOD

Patent #:	6665078	Issue Dt:	12/16/2003	Application #:	09414388	Filing Dt:	10/07/1999
Title:	SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING THIN FILM LAYER THICKNESS, REFLECTIVITY, ROUGHNESS, SURFACE PROFILE AND MAGNETIC PATTERN IN THIN FILM MAGNETIC DISKS AND SILICON WAFERS

Patent #:	6392749	Issue Dt:	05/21/2002	Application #:	09718054	Filing Dt:	11/20/2000
Title:	High speed optical profilometer for measuring surface height variation

Patent #:	NONE	Issue Dt:		Application #:	09818199	Filing Dt:	03/26/2001
Publication #:	US20020015146	Pub Dt:	02/07/2002
Title:	Combined high speed optical profilometer and ellipsometer

Patent #:	6757056	Issue Dt:	06/29/2004	Application #:	09861280	Filing Dt:	05/18/2001
Title:	COMBINED HIGH SPEED OPTICAL PROFILOMETER AND ELLIPSOMETER

Patent #:	6897957	Issue Dt:	05/24/2005	Application #:	10029957	Filing Dt:	12/21/2001
Publication #:	US20020145740	Pub Dt:	10/10/2002
Title:	MATERIAL INDEPENDENT OPTICAL PROFILOMETER

Patent #:	6930765	Issue Dt:	08/16/2005	Application #:	10126154	Filing Dt:	04/19/2002
Publication #:	US20020163634	Pub Dt:	11/07/2002
Title:	MULTIPLE SPOT SIZE OPTICAL PROFILOMETER, ELLIPSOMETER, REFLECTOMETER AND SCATTEROMETER

Patent #:	6882437	Issue Dt:	04/19/2005	Application #:	10208379	Filing Dt:	07/29/2002
Publication #:	US20030197874	Pub Dt:	10/23/2003
Title:	METHOD OF DETECTING THE THICKNESS OF THIN FILM DISKS OR WAFERS

Patent #:	6909500	Issue Dt:	06/21/2005	Application #:	10219632	Filing Dt:	08/14/2002
Publication #:	US20030025905	Pub Dt:	02/06/2003
Title:	METHOD OF DETECTING AND CLASSIFYING SCRATCHES, PARTICLES AND PITS ON THIN FILM DISKS OR WAFERS

Patent #:	6781103	Issue Dt:	08/24/2004	Application #:	10406075	Filing Dt:	04/02/2003
Title:	METHOD OF AUTOMATICALLY FOCUSING AN OPTICAL BEAM ON TRANSPARENT OR REFLECTIVE THIN FILM WAFERS OR DISKS

Patent #:	7123357	Issue Dt:	10/17/2006	Application #:	10444652	Filing Dt:	05/22/2003
Publication #:	US20040017561	Pub Dt:	01/29/2004
Title:	METHOD OF DETECTING AND CLASSIFYING SCRATCHES AND PARTICLES ON THIN FILM DISKS OR WAFERS

Patent #:	6956658	Issue Dt:	10/18/2005	Application #:	10660984	Filing Dt:	09/12/2003
Publication #:	US20040046959	Pub Dt:	03/11/2004
Title:	SYSTEM AND METHOD FOR MEASURING OBJECT CHARACTERISTICS USING PHASE DIFFERENCES IN POLARIZED LIGHT REFLECTIONS

Patent #:	7061601	Issue Dt:	06/13/2006	Application #:	10754275	Filing Dt:	01/08/2004
Publication #:	US20040169850	Pub Dt:	09/02/2004
Title:	SYSTEM AND METHOD FOR DOUBLE SIDED OPTICAL INSPECTION OF THIN FILM DISKS OR WAFERS

Patent #:	6956660	Issue Dt:	10/18/2005	Application #:	10782267	Filing Dt:	02/18/2004
Publication #:	US20040160604	Pub Dt:	08/19/2004
Title:	SYSTEM AND METHOD FOR MEASURING PROPERTIES OF AN OBJECT USING A PHASE DIFFERENCE BETWEEN TWO REFLECTED LIGHT SIGNALS

Patent #:	7075741	Issue Dt:	07/11/2006	Application #:	10867609	Filing Dt:	06/14/2004
Title:	SYSTEM AND METHOD FOR AUTOMATICALLY DETERMINING MAGNETIC ECCENTRICITY OF A DISK

Patent #:	7075630	Issue Dt:	07/11/2006	Application #:	10873892	Filing Dt:	06/21/2004
Publication #:	US20040233419	Pub Dt:	11/25/2004
Title:	COMBINED HIGH SPEED OPTICAL PROFILOMETER AND ELLIPSOMETER

Patent #:	7113284	Issue Dt:	09/26/2006	Application #:	10890774	Filing Dt:	07/13/2004
Title:	MATERIAL INDEPENDENT OPTICAL PROFILOMETER

Patent #:	7396022	Issue Dt:	07/08/2008	Application #:	10952590	Filing Dt:	09/28/2004
Title:	SYSTEM AND METHOD FOR OPTIMIZING WAFER FLATNESS AT HIGH ROTATIONAL SPEEDS

Assignor

Exec Dt:

07/15/2005

Assignee

ONE TECHNOLOGY DRIVE

MILPITAS, CALIFORNIA 95035

Correspondence name and address
	RAMIN AGHEVLI
	CAVEN & AGHEVLI LLC
	9249 S. BROADWAY, UNITE 200-201
	HIGHLANDS RANCH, CO 80129

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