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Patent Assignment Details
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Reel/Frame:057219/0246   Pages: 4
Recorded: 08/18/2021
Attorney Dkt #:FFP-000/US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 35
1
Patent #:
6295729
Issue Dt:
10/02/2001
Application #:
09164470
Filing Dt:
10/01/1998
Title:
ANGLED FLYING LEAD WIRE BONDING PROCESS
2
Patent #:
6708403
Issue Dt:
03/23/2004
Application #:
10342167
Filing Dt:
01/14/2003
Publication #:
US20030106213
Pub Dt:
06/12/2003
Title:
ANGLED FLYING LEAD WIRE BONDING PROCESS
3
Patent #:
7264984
Issue Dt:
09/04/2007
Application #:
11019912
Filing Dt:
12/21/2004
Publication #:
US20060134819
Pub Dt:
06/22/2006
Title:
PROCESS FOR FORMING MEMS
4
Patent #:
7271022
Issue Dt:
09/18/2007
Application #:
11102982
Filing Dt:
04/11/2005
Publication #:
US20060134820
Pub Dt:
06/22/2006
Title:
PROCESS FOR FORMING MICROSTRUCTURES
5
Patent #:
7245135
Issue Dt:
07/17/2007
Application #:
11194720
Filing Dt:
08/01/2005
Publication #:
US20070024297
Pub Dt:
02/01/2007
Title:
POST AND TIP DESIGN FOR A PROBE CONTACT
6
Patent #:
7362119
Issue Dt:
04/22/2008
Application #:
11194801
Filing Dt:
08/01/2005
Publication #:
US20070024298
Pub Dt:
02/01/2007
Title:
TORSION SPRING PROBE CONTACTOR DESIGN
7
Patent #:
7365553
Issue Dt:
04/29/2008
Application #:
11317408
Filing Dt:
12/22/2005
Publication #:
US20070145988
Pub Dt:
06/28/2007
Title:
PROBE CARD ASSEMBLY
8
Patent #:
7180316
Issue Dt:
02/20/2007
Application #:
11346954
Filing Dt:
02/03/2006
Title:
PROBE HEAD WITH MACHINED MOUNTING PADS AND METHOD OF FORMING SAME
9
Patent #:
7355422
Issue Dt:
04/08/2008
Application #:
11369343
Filing Dt:
03/06/2006
Publication #:
US20070063716
Pub Dt:
03/22/2007
Title:
OPTICALLY ENHANCED PROBE ALIGNMENT
10
Patent #:
7538567
Issue Dt:
05/26/2009
Application #:
11457132
Filing Dt:
07/12/2006
Publication #:
US20080012594
Pub Dt:
01/17/2008
Title:
PROBE CARD WITH BALANCED LATERAL FORCE
11
Patent #:
7365551
Issue Dt:
04/29/2008
Application #:
11535219
Filing Dt:
09/26/2006
Publication #:
US20070205782
Pub Dt:
09/06/2007
Title:
EXCESS OVERDRIVE DETECTOR FOR PROBE CARDS
12
Patent #:
8232816
Issue Dt:
07/31/2012
Application #:
11641255
Filing Dt:
12/19/2006
Publication #:
US20070182430
Pub Dt:
08/09/2007
Title:
PROBE HEAD WITH MACHINE MOUNTING PADS AND METHOD OF FORMING SAME
13
Patent #:
7589542
Issue Dt:
09/15/2009
Application #:
11734434
Filing Dt:
04/12/2007
Publication #:
US20080252310
Pub Dt:
10/16/2008
Title:
HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES
14
Patent #:
7759951
Issue Dt:
07/20/2010
Application #:
11754818
Filing Dt:
05/29/2007
Publication #:
US20080297182
Pub Dt:
12/04/2008
Title:
SEMICODUCTOR TESTING DEVICE WITH ELASTOMER INTERPOSER
15
Patent #:
7761966
Issue Dt:
07/27/2010
Application #:
11778207
Filing Dt:
07/16/2007
Publication #:
US20090021277
Pub Dt:
01/22/2009
Title:
METHOD FOR REPARING A MICROELECTROMECHANICAL SYSTEM
16
Patent #:
7922888
Issue Dt:
04/12/2011
Application #:
11796482
Filing Dt:
04/27/2007
Publication #:
US20070240306
Pub Dt:
10/18/2007
Title:
POST AND TIP DESIGN FOR A PROBE CONTACT
17
Patent #:
7759952
Issue Dt:
07/20/2010
Application #:
11901014
Filing Dt:
09/14/2007
Publication #:
US20080007281
Pub Dt:
01/10/2008
Title:
METHOD OF FORMING PROBE CARD ASSEMBLY
18
Patent #:
7791361
Issue Dt:
09/07/2010
Application #:
11953204
Filing Dt:
12/10/2007
Publication #:
US20090146675
Pub Dt:
06/11/2009
Title:
PLANARIZING PROBE CARD
19
Patent #:
7724010
Issue Dt:
05/25/2010
Application #:
11983521
Filing Dt:
11/09/2007
Publication #:
US20080106289
Pub Dt:
05/08/2008
Title:
TORSION SPRING PROBE CONTACTOR DESIGN
20
Patent #:
7728612
Issue Dt:
06/01/2010
Application #:
11986453
Filing Dt:
11/21/2007
Publication #:
US20080211525
Pub Dt:
09/04/2008
Title:
PROBE CARD ASSEMBLY AND METHOD OF FORMING SAME
21
Patent #:
7772859
Issue Dt:
08/10/2010
Application #:
12042295
Filing Dt:
03/04/2008
Publication #:
US20080252328
Pub Dt:
10/16/2008
Title:
PROBE FOR TESTING SEMICONDUCTOR DEVICES WITH FEATURES THAT INCREASE STRESS TOLERANCE
22
Patent #:
7692436
Issue Dt:
04/06/2010
Application #:
12077627
Filing Dt:
03/20/2008
Publication #:
US20090237099
Pub Dt:
09/24/2009
Title:
PROBE CARD SUBSTRATE WITH BONDED VIA
23
Patent #:
8747642
Issue Dt:
06/10/2014
Application #:
12608857
Filing Dt:
10/29/2009
Publication #:
US20110100826
Pub Dt:
05/05/2011
Title:
SUPERFILLING SECONDARY METALLIZATION PROCESS IN MEMS FABRICATION
24
Patent #:
8309382
Issue Dt:
11/13/2012
Application #:
12608873
Filing Dt:
10/29/2009
Publication #:
US20110100829
Pub Dt:
05/05/2011
Title:
MULTI MATERIAL SECONDARY METALLIZATION SCHEME IN MEMS FABRICATION
25
Patent #:
8344748
Issue Dt:
01/01/2013
Application #:
12693428
Filing Dt:
01/25/2010
Publication #:
US20120032697
Pub Dt:
02/09/2012
Title:
PROBE FOR TESTING SEMICONDUCTOR DEVICES
26
Patent #:
8305101
Issue Dt:
11/06/2012
Application #:
12709268
Filing Dt:
02/19/2010
Publication #:
US20100237887
Pub Dt:
09/23/2010
Title:
MICROELECTRONIC CONTACTOR ASSEMBLY, STRUCTURES THEREOF, AND METHODS OF CONSTRUCTING SAME
27
Patent #:
8901950
Issue Dt:
12/02/2014
Application #:
12709285
Filing Dt:
02/19/2010
Publication #:
US20100237888
Pub Dt:
09/23/2010
Title:
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, AND METHODS OF MAKING SAME
28
Patent #:
8232818
Issue Dt:
07/31/2012
Application #:
12709297
Filing Dt:
02/19/2010
Publication #:
US20100237889
Pub Dt:
09/23/2010
Title:
PROBE HEAD FOR A MICROELECTRONIC CONTACTOR ASSEMBLY, THE PROBE HEAD HAVING SMT ELECTRONIC COMPONENTS THEREON
29
Patent #:
8278956
Issue Dt:
10/02/2012
Application #:
12756578
Filing Dt:
04/08/2010
Publication #:
US20110248735
Pub Dt:
10/13/2011
Title:
PROBECARD SYSTEM AND METHOD
30
Patent #:
8268156
Issue Dt:
09/18/2012
Application #:
13308545
Filing Dt:
12/01/2011
Publication #:
US20120070980
Pub Dt:
03/22/2012
Title:
MULTI MATERIAL SECONDARY METALLIZATION SCHEME IN MEMS FABRICATION
31
Patent #:
8917106
Issue Dt:
12/23/2014
Application #:
13511137
Filing Dt:
05/21/2012
Publication #:
US20140232427
Pub Dt:
08/21/2014
Title:
FINE PITCH MICROELECTRONIC CONTACT ARRAY AND METHOD OF MAKING SAME
32
Patent #:
9194887
Issue Dt:
11/24/2015
Application #:
13744190
Filing Dt:
01/17/2013
Publication #:
US20140132298
Pub Dt:
05/15/2014
Title:
FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRICATE AND ASSEMBLE SAME
33
Patent #:
9000793
Issue Dt:
04/07/2015
Application #:
13744194
Filing Dt:
01/17/2013
Publication #:
US20140132300
Pub Dt:
05/15/2014
Title:
FINE PITCH PROBES FOR SEMICONDUCTOR TESTING, AND A METHOD TO FABRICATE AND ASSEMBLE SAME
34
Patent #:
9678108
Issue Dt:
06/13/2017
Application #:
14178171
Filing Dt:
02/11/2014
Title:
METHODS TO MANUFACTURE SEMICONDUCTOR PROBE TIPS
35
Patent #:
10564184
Issue Dt:
02/18/2020
Application #:
15428931
Filing Dt:
02/09/2017
Publication #:
US20170153273
Pub Dt:
06/01/2017
Title:
METHODS TO MANUFACTURE SEMICONDUCTOR PROBE TIPS
Assignor
1
ADVANTEST AMERICA, INC.
Exec Dt:
11/26/2020
Assignee
1
FORMFACTOR, INC.
7005 SOUTHFRONT ROAD
LIVERMORE, CALIFORNIA 94551
Correspondence name and address
RON JACOBS
438 CAMBRIDGE AVE.
SUITE 225
PALO ALTO, CA 94306

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