Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 049041/0248 | |
| Pages: | 5 |
| | Recorded: | 04/30/2019 | | |
| Attorney Dkt #: | 0128/0126M |
| Conveyance: | MERGER (SEE DOCUMENT FOR DETAILS). |
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Total properties:
11
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Patent #:
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Issue Dt:
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09/15/2015
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Application #:
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14130427
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Filing Dt:
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12/31/2013
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Publication #:
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Pub Dt:
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06/05/2014
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Title:
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ELECTROSTATIC DISCHARGE PROTECTIVE DEVICE
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Patent #:
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Issue Dt:
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07/12/2016
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Application #:
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14130439
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Filing Dt:
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04/21/2014
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Publication #:
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Pub Dt:
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08/21/2014
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Title:
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CAPACITOR AND PREPARATION METHOD THEREOF
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Patent #:
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Issue Dt:
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02/17/2015
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Application #:
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14130449
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Filing Dt:
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12/31/2013
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Publication #:
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Pub Dt:
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05/29/2014
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Title:
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HIGH-VOLTAGE SCHOTTKY DIODE AND MANUFACTURING METHOD THEREOF
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Patent #:
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Issue Dt:
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01/12/2016
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Application #:
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14130476
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Filing Dt:
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12/31/2013
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Publication #:
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Pub Dt:
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05/29/2014
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Title:
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METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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05/01/2018
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Application #:
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14236473
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Filing Dt:
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01/31/2014
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Publication #:
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Pub Dt:
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06/19/2014
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Title:
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TEST PATTERN FOR TRENCH POLY OVER-ETCHED STEP AND FORMATION METHOD THEREOF
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Patent #:
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Issue Dt:
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02/17/2015
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Application #:
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14351828
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Filing Dt:
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04/14/2014
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Publication #:
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Pub Dt:
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11/06/2014
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Title:
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METHOD FOR MANUFACTURING SEMICONDUCTOR THICK METAL STRUCTURE
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Patent #:
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Issue Dt:
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04/14/2015
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Application #:
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14364933
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Filing Dt:
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06/12/2014
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Publication #:
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Pub Dt:
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11/27/2014
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Title:
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MONITORING STRUCTURE AND MONITORING METHOD FOR SILICON WET ETCHING DEPTH
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Patent #:
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Issue Dt:
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03/21/2017
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Application #:
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14376021
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Filing Dt:
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07/31/2014
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Publication #:
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Pub Dt:
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07/30/2015
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Title:
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TRENCH FIELD-EFFECT DEVICE AND METHOD OF FABRICATING SAME
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Patent #:
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Issue Dt:
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12/05/2017
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Application #:
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15327230
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Filing Dt:
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01/18/2017
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Publication #:
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Pub Dt:
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06/22/2017
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Title:
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METHOD FOR MANUFACTURING MEMS TORSIONAL ELECTROSTATIC ACTUATOR
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Patent #:
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Issue Dt:
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05/28/2019
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Application #:
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15327902
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Filing Dt:
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01/20/2017
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Publication #:
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Pub Dt:
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07/20/2017
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Title:
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METHOD FOR MANUFACTURING MEMS DOUBLE-LAYER SUSPENSION MICROSTRUCTURE, AND MEMS INFRARED DETECTOR
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Patent #:
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Issue Dt:
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07/02/2019
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Application #:
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15731768
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Filing Dt:
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07/28/2017
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Publication #:
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Pub Dt:
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12/27/2018
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Title:
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POWER ON RESET CIRCUIT
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Assignee
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| NO. 8 XINZHOU ROAD WUXI NEW DISTRICT |
| JIANGSU, CHINA 214028 |
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Correspondence name and address
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MUNCY, GEISSLER, OLDS & LOWE, P.C.
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4000 LEGATO RD., SUITE 310
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FAIRFAX, VA 22033
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