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Reel/Frame:031339/0314   Pages: 6
Recorded: 10/03/2013
Attorney Dkt #:KLA149D1C1,149D1R1,016FC2
Conveyance: MERGER (SEE DOCUMENT FOR DETAILS).
Total properties: 3
1
Patent #:
NONE
Issue Dt:
Application #:
11675021
Filing Dt:
02/14/2007
Publication #:
Pub Dt:
10/09/2008
Title:
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRATED CIRCUITS
2
Patent #:
Issue Dt:
11/10/2015
Application #:
13407124
Filing Dt:
02/28/2012
Publication #:
Pub Dt:
06/21/2012
Title:
APPARATUS AND METHODS FOR DETERMINING OVERLAY OF STRUCTURES HAVING ROTATIONAL OR MIRROR SYMMETRY
3
Patent #:
Issue Dt:
11/18/2014
Application #:
13875160
Filing Dt:
05/01/2013
Title:
APPARATUS AND METHODS FOR DETERMINING OVERLAY OF STRUCTURES HAVING ROTATIONAL OR MIRROR SYMMETRY
Assignor
1
Exec Dt:
06/30/2009
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
KWAN & OLYNICK LLP
2000 HEARST AVENUE, SUITE 305
BERKELEY, CA 94709

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