Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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Reel/Frame: | 031339/0314 | |
| Pages: | 6 |
| | Recorded: | 10/03/2013 | | |
Attorney Dkt #: | KLA149D1C1,149D1R1,016FC2 |
Conveyance: | MERGER (SEE DOCUMENT FOR DETAILS). |
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Total properties:
3
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11675021
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Filing Dt:
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02/14/2007
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Publication #:
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Pub Dt:
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10/09/2008
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Title:
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TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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11/10/2015
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Application #:
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13407124
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Filing Dt:
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02/28/2012
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Publication #:
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Pub Dt:
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06/21/2012
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Title:
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APPARATUS AND METHODS FOR DETERMINING OVERLAY OF STRUCTURES HAVING ROTATIONAL OR MIRROR SYMMETRY
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Patent #:
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Issue Dt:
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11/18/2014
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Application #:
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13875160
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Filing Dt:
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05/01/2013
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Title:
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APPARATUS AND METHODS FOR DETERMINING OVERLAY OF STRUCTURES HAVING ROTATIONAL OR MIRROR SYMMETRY
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Assignee
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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KWAN & OLYNICK LLP
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2000 HEARST AVENUE, SUITE 305
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BERKELEY, CA 94709
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