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Reel/Frame:020753/0337   Pages: 10
Recorded: 04/04/2008
Attorney Dkt #:27592-01026
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 15
1
Patent #:
6687865
Issue Dt:
02/03/2004
Application #:
09275726
Filing Dt:
03/24/1999
Title:
ON-CHIP SERVICE PROCESSOR FOR TEST AND DEBUG OF INTEGRATED CIRCUITS
2
Patent #:
7234092
Issue Dt:
06/19/2007
Application #:
10351276
Filing Dt:
01/24/2003
Publication #:
US20030229834
Pub Dt:
12/11/2003
Title:
VARIABLE CLOCKED SCAN TEST CIRCUITRY AND METHOD
3
Patent #:
7197681
Issue Dt:
03/27/2007
Application #:
10750949
Filing Dt:
01/05/2004
Publication #:
US20040148554
Pub Dt:
07/29/2004
Title:
ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
4
Patent #:
6964001
Issue Dt:
11/08/2005
Application #:
10767265
Filing Dt:
01/30/2004
Publication #:
US20040187054
Pub Dt:
09/23/2004
Title:
ON-CHIP SERVICE PROCESSOR
5
Patent #:
NONE
Issue Dt:
Application #:
10922830
Filing Dt:
08/23/2004
Publication #:
US20060041798
Pub Dt:
02/23/2006
Title:
Design techniques to increase testing efficiency
6
Patent #:
7188286
Issue Dt:
03/06/2007
Application #:
10931079
Filing Dt:
09/01/2004
Publication #:
US20050028060
Pub Dt:
02/03/2005
Title:
ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
7
Patent #:
7200784
Issue Dt:
04/03/2007
Application #:
10931191
Filing Dt:
09/01/2004
Publication #:
US20050154948
Pub Dt:
07/14/2005
Title:
ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
8
Patent #:
7353470
Issue Dt:
04/01/2008
Application #:
11182809
Filing Dt:
07/18/2005
Publication #:
US20060195746
Pub Dt:
08/31/2006
Title:
VARIABLE CLOCKED SCAN TEST IMPROVEMENTS
9
Patent #:
7421563
Issue Dt:
09/02/2008
Application #:
11208882
Filing Dt:
08/23/2005
Publication #:
US20070050596
Pub Dt:
03/01/2007
Title:
HASHING AND SERIAL DECODING TECHNIQUES
10
Patent #:
7412636
Issue Dt:
08/12/2008
Application #:
11208883
Filing Dt:
08/23/2005
Publication #:
US20070168798
Pub Dt:
07/19/2007
Title:
SCAN STRING SEGMENTATION FOR DIGITAL TEST COMPRESSION
11
Patent #:
7080301
Issue Dt:
07/18/2006
Application #:
11261762
Filing Dt:
10/31/2005
Publication #:
US20060064615
Pub Dt:
03/23/2006
Title:
ON-CHIP SERVICE PROCESSOR
12
Patent #:
7836371
Issue Dt:
11/16/2010
Application #:
11424610
Filing Dt:
06/16/2006
Publication #:
US20080168309
Pub Dt:
07/10/2008
Title:
ON-CHIP SERVICE PROCESSOR
13
Patent #:
7752515
Issue Dt:
07/06/2010
Application #:
11680684
Filing Dt:
03/01/2007
Publication #:
US20070162803
Pub Dt:
07/12/2007
Title:
ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
14
Patent #:
7890899
Issue Dt:
02/15/2011
Application #:
12046336
Filing Dt:
03/11/2008
Publication #:
US20080163020
Pub Dt:
07/03/2008
Title:
VARIABLE CLOCKED SCAN TEST IMPROVEMENTS
15
Patent #:
RE41187
Issue Dt:
03/30/2010
Application #:
12047408
Filing Dt:
03/13/2008
Title:
VARIABLE CLOCKED SCAN TEST CIRCUITRY AND METHOD
Assignor
1
ON-CHIP TECHNOLOGIES, INC.
Exec Dt:
03/13/2008
Assignee
1
OC APPLICATIONS RESEARCH LLC
1209 ORANGE STREET
WILMINGTON, DELAWARE 19801
Correspondence name and address
CONNOLLY BOVE LODGE & HUTZ LLP
1875 EYE STREET NW, SUITE 1100
WASHINGTON, DC 20006

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