Patent Assignment Details
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| Reel/Frame: | 016693/0343 | |
| Pages: | 9 |
| | Recorded: | 06/15/2005 | | |
| Conveyance: | RE-RECORD TO CORRECT THE SERIAL NUMBER ON A DOCUMENT PREVIOUSLY RECORDED AT REEL 016069, FRAME 0098. (CHANGE OF NAME) |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/31/2005
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Application #:
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09927368
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Filing Dt:
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08/13/2001
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Publication #:
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Pub Dt:
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08/08/2002
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Title:
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APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
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Assignee
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| 1 MIZUHARA 4-CHOME, ITAMI-SHI |
| HYOGO, 664-0005, JAPAN |
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Correspondence name and address
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MCDERMOTT WILL & EMERY LLP
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600 13TH STREET, N.W.
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WASHINGTON, D.C. 20005-3096
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