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Reel/Frame:	045765/0354			Pages:	4
		Recorded:	01/15/2018
Attorney Dkt #:	02954/808000-000
Conveyance:	CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).

Total properties: 45

Patent #:	6173037	Issue Dt:	01/09/2001	Application #:	09351381	Filing Dt:	07/13/1999
Title:	METHOD OF AND APPARATUS FOR X-RAY FLUORESCENT ANALYSIS OF THIN LAYERS

Patent #:	6263042	Issue Dt:	07/17/2001	Application #:	09406285	Filing Dt:	09/24/1999
Title:	APPARATUS FOR X-RAY ANALYSIS IN GRAZING EXIT CONDITIONS

Patent #:	6233306	Issue Dt:	05/15/2001	Application #:	09414461	Filing Dt:	10/07/1999
Title:	X-RAY IRRADIATION APPARATUS INCLUDING AN X-RAY SOURCE PROVIDED WITH A CAPILLARY OPTICAL SYSTEM.

Patent #:	6310937	Issue Dt:	10/30/2001	Application #:	09426522	Filing Dt:	10/26/1999
Title:	X-RAY DIFFRACTION APPARATUS WITH AN X-RAY OPTICAL REFERENCE CHANNEL

Patent #:	6359968	Issue Dt:	03/19/2002	Application #:	09501895	Filing Dt:	02/10/2000
Title:	X-ray tube

Patent #:	6370490	Issue Dt:	04/09/2002	Application #:	09592059	Filing Dt:	06/12/2000
Title:	METHOD OF DETERMINING AN INTRINSIC SPECTRUM FROM A MEASURED SPECTRUM

Patent #:	6370220	Issue Dt:	04/09/2002	Application #:	09691809	Filing Dt:	10/19/2000
Title:	METHOD OF AND DEVICE FOR FLUORESCENT X-RAY ANALYSIS OF A SAMPLE

Patent #:	6560313	Issue Dt:	05/06/2003	Application #:	09713877	Filing Dt:	11/16/2000
Title:	MONOCHROMATIC X-RAY SOURCE

Patent #:	6738717	Issue Dt:	05/18/2004	Application #:	09817973	Filing Dt:	03/27/2001
Publication #:	US20020082781	Pub Dt:	06/27/2002
Title:	CRYSTAL STRUCTURE ANALYSIS METHOD

Patent #:	6574305	Issue Dt:	06/03/2003	Application #:	09988844	Filing Dt:	11/19/2001
Publication #:	US20020085669	Pub Dt:	07/04/2002
Title:	DEVICE AND METHOD FOR THE INSPECTION OF THE CONDITION OF A SAMPLE

Patent #:	6731719	Issue Dt:	05/04/2004	Application #:	10022150	Filing Dt:	12/13/2001
Publication #:	US20020075995	Pub Dt:	06/20/2002
Title:	X-RAY DIFFRACTOMETER

Patent #:	6823043	Issue Dt:	11/23/2004	Application #:	10179323	Filing Dt:	06/25/2002
Publication #:	US20030012337	Pub Dt:	01/16/2003
Title:	DETERMINATION OF MATERIAL PARAMETERS

Patent #:	7194067	Issue Dt:	03/20/2007	Application #:	10479498	Filing Dt:	07/13/2004
Publication #:	US20040240620	Pub Dt:	12/02/2004
Title:	X-RAY OPTICAL SYSTEM

Patent #:	7042978	Issue Dt:	05/09/2006	Application #:	10482562	Filing Dt:	06/08/2004
Publication #:	US20040234029	Pub Dt:	11/25/2004
Title:	EXAMINATION OF MATERIAL SAMPLES

Patent #:	7242743	Issue Dt:	07/10/2007	Application #:	10511571	Filing Dt:	05/16/2005
Publication #:	US20050226379	Pub Dt:	10/13/2005
Title:	X-RAY DIFFRACTION APPARATUS AND METHOD

Patent #:	7116754	Issue Dt:	10/03/2006	Application #:	11065715	Filing Dt:	02/24/2005
Publication #:	US20050195941	Pub Dt:	09/08/2005
Title:	DIFFRACTOMETER

Patent #:	7516031	Issue Dt:	04/07/2009	Application #:	11370238	Filing Dt:	03/07/2006
Publication #:	US20060206278	Pub Dt:	09/14/2006
Title:	APPARATUS AND METHOD FOR CORRECTING FOR ABERRATIONS

Patent #:	7477724	Issue Dt:	01/13/2009	Application #:	11377908	Filing Dt:	03/16/2006
Publication #:	US20060215818	Pub Dt:	09/28/2006
Title:	X-RAY INSTRUMENT

Patent #:	7542547	Issue Dt:	06/02/2009	Application #:	12014437	Filing Dt:	01/15/2008
Publication #:	US20080175352	Pub Dt:	07/24/2008
Title:	X-RAY DIFFRACTION EQUIPMENT FOR X-RAY SCATTERING

Patent #:	7538328	Issue Dt:	05/26/2009	Application #:	12041148	Filing Dt:	03/03/2008
Title:	IMAGING DETECTOR

Patent #:	7720192	Issue Dt:	05/18/2010	Application #:	12080816	Filing Dt:	04/04/2008
Publication #:	US20080310587	Pub Dt:	12/18/2008
Title:	X-RAY FLUORESCENCE APPARATUS

Patent #:	7858945	Issue Dt:	12/28/2010	Application #:	12365562	Filing Dt:	02/04/2009
Publication #:	US20090200478	Pub Dt:	08/13/2009
Title:	IMAGING DETECTOR

Patent #:	7756248	Issue Dt:	07/13/2010	Application #:	12370540	Filing Dt:	02/12/2009
Publication #:	US20090232276	Pub Dt:	09/17/2009
Title:	X-RAY DETECTION IN PACKAGING

Patent #:	8223923	Issue Dt:	07/17/2012	Application #:	12596656	Filing Dt:	02/18/2010
Publication #:	US20100150315	Pub Dt:	06/17/2010
Title:	X-RAY SOURCE WITH METAL WIRE CATHODE

Patent #:	7978820	Issue Dt:	07/12/2011	Application #:	12604305	Filing Dt:	10/22/2009
Publication #:	US20110096898	Pub Dt:	04/28/2011
Title:	X-RAY DIFFRACTION AND FLUORESCENCE

Patent #:	8210000	Issue Dt:	07/03/2012	Application #:	12825987	Filing Dt:	06/29/2010
Publication #:	US20110154858	Pub Dt:	06/30/2011
Title:	BEAD FURNACE

Patent #:	8488740	Issue Dt:	07/16/2013	Application #:	12949539	Filing Dt:	11/18/2010
Publication #:	US20120128128	Pub Dt:	05/24/2012
Title:	DIFFRACTOMETER

Patent #:	8477904	Issue Dt:	07/02/2013	Application #:	12968156	Filing Dt:	12/14/2010
Publication #:	US20110200164	Pub Dt:	08/18/2011
Title:	X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY

Patent #:	8437451	Issue Dt:	05/07/2013	Application #:	13005229	Filing Dt:	01/12/2011
Publication #:	US20120177180	Pub Dt:	07/12/2012
Title:	X-RAY SHUTTER ARRANGEMENT

Patent #:	9110003	Issue Dt:	08/18/2015	Application #:	13780216	Filing Dt:	02/28/2013
Publication #:	US20130243159	Pub Dt:	09/19/2013
Title:	MICRODIFFRACTION

Patent #:	9239305	Issue Dt:	01/19/2016	Application #:	13869693	Filing Dt:	04/24/2013
Publication #:	US20140146940	Pub Dt:	05/29/2014
Title:	SAMPLE HOLDER

Patent #:	9506880	Issue Dt:	11/29/2016	Application #:	14311659	Filing Dt:	06/23/2014
Publication #:	US20150003592	Pub Dt:	01/01/2015
Title:	DIFFRACTION IMAGING

Patent #:	9640292	Issue Dt:	05/02/2017	Application #:	14547976	Filing Dt:	11/19/2014
Publication #:	US20150200030	Pub Dt:	07/16/2015
Title:	X-RAY APPARATUS

Patent #:	9658352	Issue Dt:	05/23/2017	Application #:	14593712	Filing Dt:	01/09/2015
Publication #:	US20150198727	Pub Dt:	07/16/2015
Title:	METHOD OF MAKING A STANDARD

Patent #:	9547094	Issue Dt:	01/17/2017	Application #:	14624005	Filing Dt:	02/17/2015
Publication #:	US20150234060	Pub Dt:	08/20/2015
Title:	X-ray Analysis Apparatus

Patent #:	9851313	Issue Dt:	12/26/2017	Application #:	14636938	Filing Dt:	03/03/2015
Publication #:	US20160258889	Pub Dt:	09/08/2016
Title:	QUANTITATIVE X-RAY ANALYSIS - RATIO CORRECTION

Patent #:	9784699	Issue Dt:	10/10/2017	Application #:	14636950	Filing Dt:	03/03/2015
Publication #:	US20160258890	Pub Dt:	09/08/2016
Title:	Quantitative X-ray Analysis - Matrix thickness correction

Patent #:	9739730	Issue Dt:	08/22/2017	Application #:	14637833	Filing Dt:	03/04/2015
Publication #:	US20160258892	Pub Dt:	09/08/2016
Title:	QUANTITATIVE X-RAY ANALYSIS - MULTI OPTICAL PATH INSTRUMENT

Patent #:	10107551	Issue Dt:	10/23/2018	Application #:	14792905	Filing Dt:	07/07/2015
Publication #:	US20160010920	Pub Dt:	01/14/2016
Title:	Preparation of samples for XRF using flux and platinum crucible

Patent #:	9911569	Issue Dt:	03/06/2018	Application #:	14993163	Filing Dt:	01/12/2016
Publication #:	US20160203939	Pub Dt:	07/14/2016
Title:	X-RAY TUBE ANODE ARRANGEMENT

Patent #:	10359376	Issue Dt:	07/23/2019	Application #:	15214575	Filing Dt:	07/20/2016
Publication #:	US20180024081	Pub Dt:	01/25/2018
Title:	SAMPLE HOLDER FOR X-RAY ANALYSIS

Patent #:	10281414	Issue Dt:	05/07/2019	Application #:	15366632	Filing Dt:	12/01/2016
Publication #:	US20180156745	Pub Dt:	06/07/2018
Title:	Conical Collimator for X-ray Measurements

Patent #:	10352881	Issue Dt:	07/16/2019	Application #:	15391356	Filing Dt:	12/27/2016
Publication #:	US20180180560	Pub Dt:	06/28/2018
Title:	Computed Tomography

Patent #:	10564115	Issue Dt:	02/18/2020	Application #:	15586465	Filing Dt:	05/04/2017
Publication #:	US20170343495	Pub Dt:	11/30/2017
Title:	X-RAY ANALYSIS OF DRILLING FLUID

Patent #:	NONE	Issue Dt:		Application #:	15608533	Filing Dt:	05/30/2017
Publication #:	US20180348150	Pub Dt:	12/06/2018
Title:	Pressed Powder Sample Measurements Using X-ray Fluorescence

Assignor

PANALYTICAL B.V.

Exec Dt:

11/21/2017

Assignee

MALVERN PANALYTICAL B.V.

LELYWEG 1, 7602 EA

P O BOX 13

ALMELO, NETHERLANDS 7600 AA

Correspondence name and address
	LEASON ELLIS LLP
	ONE BARKER AVENUE
	FIFTH FLOOR
	WHITE PLAINS, NY 10601

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