Patent Assignment Details
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| Reel/Frame: | 041745/0359 | |
| Pages: | 3 |
| | Recorded: | 03/26/2017 | | |
| Attorney Dkt #: | P94857 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/23/2019
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Application #:
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15391551
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Filing Dt:
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12/27/2016
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Publication #:
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Pub Dt:
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06/29/2017
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Title:
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SYSTEMS AND PROCESSES FOR MEASURING THICKNESS VALUES OF SEMICONDUCTOR SUBSTRATES
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Assignee
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| 2200 MISSION COLLEGE BOULEVARD |
| SANTA CLARA, CALIFORNIA 95054 |
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Correspondence name and address
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DAVID W. OSBORNE
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P.O. BOX 1219
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THORPE NORTH & WESTERN, LLP
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SANDY, UT 84091-1219
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