Patent Assignment Details
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Reel/Frame: | 011166/0372 | |
| Pages: | 3 |
| | Recorded: | 09/28/2000 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/04/2003
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Application #:
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09671207
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Filing Dt:
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09/28/2000
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Title:
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METHOD AND APPARATUS FOR DETECTING THICKNESS OF THIN LAYER FORMED ON A WAFER
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Assignee
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416, MAETAN-DONG, PALDAL-GU |
SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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Correspondence name and address
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JONES VOLENTINE, LLC
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ADAM C. VOLENTINE
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12200 SUNRISE VALLEY DRIVE, SUITE 150
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RESTON, VA 20191
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