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Patent Assignment Details
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Reel/Frame:010310/0378   Pages: 11
Recorded: 10/19/1999
Conveyance: SECURITY AGREEMENT
Total properties: 6
1
Patent #:
Issue Dt:
04/06/1993
Application #:
07756325
Filing Dt:
09/06/1991
Title:
TEST SYSTEM APPARATUS WITH SCHOTTKY DIODES WITH PROGRAMMABLE VOLTAGES
2
Patent #:
Issue Dt:
03/02/1993
Application #:
07849521
Filing Dt:
03/11/1992
Title:
PHASE SHIFT VERNIER FOR AUTOMATIC TEST SYSTEMS
3
Patent #:
Issue Dt:
05/17/1994
Application #:
08011239
Filing Dt:
01/29/1993
Title:
LOAD SENSING AND MEASURING SYSTEM
4
Patent #:
Issue Dt:
12/02/1997
Application #:
08633071
Filing Dt:
04/16/1996
Title:
DIFFERENTIAL TIME INTERPOLATOR
5
Patent #:
Issue Dt:
02/10/1998
Application #:
08633172
Filing Dt:
04/16/1996
Title:
IMPROVED TEST SYSTEM INCLUDING A LOCAL TRIGGER SIGNAL GENERATOR FOR EACH OF A PLURALITY OF TEST INSTRUMENTS
6
Patent #:
Issue Dt:
12/02/1997
Application #:
08721973
Filing Dt:
09/27/1996
Title:
HIGH SPEED IDDQ MONITOR CIRCUIT
Assignor
1
Exec Dt:
10/01/1999
Assignee
1
LOAN DOC. HG150
3003 TASMAN DR
SANTA CLARA, CALIFORNIA 95054
Correspondence name and address
SILICON VALLEY BANK
3003 TASMAN DR.
SANTA CLARA, CA 95054

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