skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:028350/0420   Pages: 7
Recorded: 06/11/2012
Attorney Dkt #:528.000
Conveyance: CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Total properties: 35
1
Patent #:
Issue Dt:
05/25/1999
Application #:
08946303
Filing Dt:
10/07/1997
Title:
FOLDED LOW-POWER INTERFERENCE MICROSCOPE OBJECTIVE
2
Patent #:
Issue Dt:
11/23/1999
Application #:
08992310
Filing Dt:
12/17/1997
Title:
SELECTION PROCESS FOR SEQUENTIALLY COMBINING MULTIPLE SETS OF OVERLAPPING SURFACE-PROFILE INTERFEROMETRIC DATA TO PRODUCE A CONTINUOUS COMPOSITE MAP
3
Patent #:
Issue Dt:
07/27/1999
Application #:
09121765
Filing Dt:
07/23/1998
Title:
SYSTEM FOR ELIMINATING SCATTERED LIGHT IN AUTOCOLLIMATOR FOR MAGNETIC-HEAD SUSPENSION MEASURING INSTRUMENT
4
Patent #:
Issue Dt:
01/13/2004
Application #:
09135734
Filing Dt:
08/18/1998
Title:
HIGH SPEED AUTOFOCUS AND TILT FOR AN OPTICAL IMAGING SYSTEM
5
Patent #:
Issue Dt:
02/13/2001
Application #:
09291521
Filing Dt:
04/14/1999
Title:
DISK-MOUNT DEVICE FOR AUTOMATIC SUCCESSIVE TESTING OF COMPUTER-DRIVE DISK BLANKS BY INTERFEROMETRY
6
Patent #:
Issue Dt:
04/08/2003
Application #:
09452334
Filing Dt:
11/30/1999
Title:
EMBEDDED INTERFEROMETER FOR REFERENCE-MIRROR CALIBRATION OF INTERFEROMETRIC MICROSCOPE
7
Patent #:
Issue Dt:
04/22/2003
Application #:
09497567
Filing Dt:
02/03/2000
Title:
AUTOMATED MINIMIZATION OF OPTICAL PATH DIFFERENCE AND REFERENCE MIRROR FOCUS IN WHITE-LIGHT INTERFERENCE MICROSCOPE OBJECTIVE
8
Patent #:
Issue Dt:
04/29/2003
Application #:
09505500
Filing Dt:
02/17/2000
Title:
PULSED SOURCE SCANNING INTERFEROMETER
9
Patent #:
Issue Dt:
09/10/2002
Application #:
09569131
Filing Dt:
05/11/2000
Title:
LATERAL-SCANNING INTERFEROMETRIC WITH TILTED OPTICAL AXIS
10
Patent #:
Issue Dt:
10/01/2002
Application #:
09585370
Filing Dt:
06/01/2000
Title:
ALIGNMENT OF MAGNETIC HEADS FOR AUTOMATIC IDENTIFICATION OF REGIONS OF INTEREST FOR INTERFEROMETRIC MEASUREMENT
11
Patent #:
Issue Dt:
07/24/2001
Application #:
09664141
Filing Dt:
09/18/2000
Title:
Self-centering crash protection mechanism for interference microscope objective
12
Patent #:
Issue Dt:
05/18/2004
Application #:
09679277
Filing Dt:
10/04/2000
Title:
REDUCED NOISE SENSITIVITY METHOD AND APPARATUS FOR CONVERTING AN INTERFEROGRAM PHASE MAP TO A SURFACE PROFILE MAP
13
Patent #:
Issue Dt:
12/10/2002
Application #:
09833880
Filing Dt:
04/12/2001
Publication #:
Pub Dt:
10/17/2002
Title:
BAT-WING ATTENUATION IN WHITE-LIGHT INTERFEROMETRY
14
Patent #:
Issue Dt:
09/23/2003
Application #:
09875638
Filing Dt:
06/06/2001
Title:
CORRECTION OF SCANNING ERRORS IN INTERFEROMETRIC PROFILING
15
Patent #:
Issue Dt:
09/23/2003
Application #:
09888826
Filing Dt:
06/25/2001
Publication #:
Pub Dt:
12/26/2002
Title:
SCANNING INTERFEROMETRY WITH REFERENCE SIGNAL
16
Patent #:
Issue Dt:
01/17/2006
Application #:
10109361
Filing Dt:
03/28/2002
Title:
REFERENCE SIGNAL FOR STITCHING OF INTERFEROMETRIC PROFILES
17
Patent #:
Issue Dt:
01/25/2005
Application #:
10262057
Filing Dt:
10/01/2002
Publication #:
Pub Dt:
02/20/2003
Title:
ALIGNMENT AND CORRECTION TEMPLATE FOR OPTICAL PROFILOMETRIC MEASUREMENT
18
Patent #:
Issue Dt:
03/21/2006
Application #:
10426349
Filing Dt:
04/30/2003
Publication #:
Pub Dt:
11/04/2004
Title:
MICROSCOPE WITH FIXED-ELEMENT AUTOCOLLIMATOR FOR TILT ADJUSTMENT
19
Patent #:
Issue Dt:
10/16/2007
Application #:
10759686
Filing Dt:
01/16/2004
Publication #:
Pub Dt:
07/21/2005
Title:
MEASUREMENT OF OBJECT DEFORMATION WITH OPTICAL PROFILER
20
Patent #:
Issue Dt:
10/10/2006
Application #:
10869138
Filing Dt:
06/16/2004
Publication #:
Pub Dt:
12/22/2005
Title:
FILM THICKNESS AND BOUNDARY CHARACTERIZATION BY INTERFEROMETRIC PROFILOMETRY
21
Patent #:
Issue Dt:
05/20/2008
Application #:
11003538
Filing Dt:
12/03/2004
Publication #:
Pub Dt:
06/08/2006
Title:
PROFILOMETRY THROUGH DISPERSIVE MEDIUM USING COLLIMATED LIGHT WITH COMPENSATING OPTICS
22
Patent #:
Issue Dt:
05/01/2007
Application #:
11061178
Filing Dt:
02/18/2005
Publication #:
Pub Dt:
06/08/2006
Title:
MOUNTING MECHANISM FOR COMPENSATING OPTICS IN INTERFEROMETER
23
Patent #:
Issue Dt:
11/03/2009
Application #:
11300945
Filing Dt:
12/15/2005
Publication #:
Pub Dt:
06/21/2007
Title:
MEASUREMENT OF THIN FILMS USING FOURIER AMPLITUDE
24
Patent #:
Issue Dt:
11/03/2009
Application #:
11300945
Filing Dt:
12/15/2005
Publication #:
Pub Dt:
06/21/2007
Title:
MEASUREMENT OF THIN FILMS USING FOURIER AMPLITUDE
25
Patent #:
Issue Dt:
10/20/2009
Application #:
11473447
Filing Dt:
06/23/2006
Title:
HIGH-DEFINITION VERTICAL-SCAN INTERFEROMETRY
26
Patent #:
Issue Dt:
01/04/2011
Application #:
11679544
Filing Dt:
02/27/2007
Publication #:
Pub Dt:
05/22/2008
Title:
SOLID-STATE IMAGING DEVICE, METHOD OF DRIVING SOLID-STATE IMAGING DEVICE, AND CAMERA
27
Patent #:
Issue Dt:
02/02/2010
Application #:
11714343
Filing Dt:
03/06/2007
Publication #:
Pub Dt:
09/11/2008
Title:
VARIABLE-WAVELENGTH ILLUMINATION SYSTEM FOR INTERFEROMETRY
28
Patent #:
Issue Dt:
02/02/2010
Application #:
11714343
Filing Dt:
03/06/2007
Publication #:
Pub Dt:
09/11/2008
Title:
VARIABLE-WAVELENGTH ILLUMINATION SYSTEM FOR INTERFEROMETRY
29
Patent #:
Issue Dt:
07/03/2012
Application #:
11824127
Filing Dt:
06/29/2007
Publication #:
Pub Dt:
01/01/2009
Title:
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
30
Patent #:
Issue Dt:
03/17/2009
Application #:
11827737
Filing Dt:
07/13/2007
Publication #:
Pub Dt:
01/15/2009
Title:
INTERFEROMETRIC ITERATIVE TECHNIQUE WITH BANDWIDTH AND NUMERICAL-APERTURE DEPENDENCY
31
Patent #:
Issue Dt:
03/17/2009
Application #:
11827737
Filing Dt:
07/13/2007
Publication #:
Pub Dt:
01/15/2009
Title:
INTERFEROMETRIC ITERATIVE TECHNIQUE WITH BANDWIDTH AND NUMERICAL-APERTURE DEPENDENCY
32
Patent #:
Issue Dt:
10/05/2010
Application #:
12009424
Filing Dt:
01/18/2008
Publication #:
Pub Dt:
07/23/2009
Title:
INTERFEROMETRIC MEASUREMENT OF DLC LAYER ON MAGNETIC HEAD
33
Patent #:
Issue Dt:
10/05/2010
Application #:
12009424
Filing Dt:
01/18/2008
Publication #:
Pub Dt:
07/23/2009
Title:
INTERFEROMETRIC MEASUREMENT OF DLC LAYER ON MAGNETIC HEAD
34
Patent #:
Issue Dt:
03/01/2011
Application #:
12082846
Filing Dt:
04/15/2008
Title:
REAL-TIME SCANNER-NONLINEARITY ERROR CORRECTION FOR HDVSI
35
Patent #:
Issue Dt:
06/07/2011
Application #:
12766744
Filing Dt:
04/23/2010
Title:
REAL-TIME EFFECTIVE-WAVELENGTH ERROR CORRECTION FOR HDVSI
Assignor
1
Exec Dt:
10/07/2010
Assignee
1
112 ROBIN HILL ROAD
SANTA BARBARA, CALIFORNIA 93117
Correspondence name and address
BOYLE FREDRICKSON, S.C.
840 NORTH PLANKINTON AVENUE
MILWAUKEE, WI 53203

Search Results as of: 06/06/2024 07:24 AM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT