Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 017317/0421 | |
| Pages: | 8 |
| | Recorded: | 03/16/2006 | | |
| Attorney Dkt #: | P25051 |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNORS NAMES PREVIOUSLY RECORDED ON REEL 017162 FRAME 0909. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECTED OF RECORDATION AT REEL 015318 AND FRAMW 0393. |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/07/2006
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Application #:
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10814252
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Filing Dt:
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04/01/2004
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Publication #:
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Pub Dt:
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12/30/2004
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Title:
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APPARATUS AND MEASUREMENT PROCEDURE FOR THE FAST, QUANTITATIVE, NON-CONTACT TOPOGRAPHIC INVESTIGATION OF SEMICONDUCTOR WAFERS AND OTHER MIRROR LIKE SURFACES
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Assignees
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| HANSASTR. 27C, |
| MUNICH, GERMANY 80686 |
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| KONKOLY-THEGE UT 29-33, |
| BUDAPEST, HUNGARY H-1121 |
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Correspondence name and address
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GREENBLUM & BERNSTEIN, P.L.C.
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1950 ROLAND CLARKE PLACE
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P25051
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RESTON, VA 20191
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