Patent Assignment Details
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| Reel/Frame: | 023726/0434 | |
| Pages: | 3 |
| | Recorded: | 12/31/2009 | | |
| Attorney Dkt #: | 101027 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/05/2012
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Application #:
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12650727
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Filing Dt:
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12/31/2009
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Publication #:
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Pub Dt:
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06/02/2011
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Title:
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TEST CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS USING THE SAME, AND TEST METHOD OF THE SEMICONDUCTOR MEMORY APPARATUS
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Assignee
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| SAN 136-1, AMI-RI, BUBAL-EUB |
| ICHON-SI, GYEONGGI-DO, 467-860, KOREA, REPUBLIC OF |
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Correspondence name and address
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ECHELON LAW GROUP, PC
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1919 GALLOWS ROAD., SUITE 330
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VIENNA, VA 22182
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