Patent Assignment Details
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Reel/Frame: | 012854/0440 | |
| Pages: | 3 |
| | Recorded: | 04/22/2002 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/14/2003
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Application #:
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10067604
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Filing Dt:
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02/04/2002
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Title:
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SYSTEM AND METHOD FOR X-RAY REFLECTOMETRY MEASUREMENT OF LOW DENSITY FILMS
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Assignee
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1250 RELIANCE WAY |
FREMONT, CALIFORNIA 94539 |
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Correspondence name and address
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STALLMAN & POLLOCK LLP
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ATTN: BRIAN J. KEATING
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121 SPEAR STREET, SUITE 290
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SAN FRANCISCO, CA 94105
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