Patent Assignment Details
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Reel/Frame: | 006687/0452 | |
| Pages: | 3 |
| | Recorded: | 09/14/1993 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/26/1995
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Application #:
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08091261
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Filing Dt:
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07/15/1993
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Title:
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SEMICONDUCTOR TEST SYSTEM, SEMICONDUCTOR TEST METHOD, METHOD OF WIRING PATTERN FORMATION AND SEMICONDUCTOR INTEGRATED CIRCUIT
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Assignee
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6-2, OOTEMACHI 2-CHOME, CHIYODA-KU |
TOKYO, JAPAN |
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Correspondence name and address
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MARVIN J. SPIVAK
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OBLON, SPIVAK, MCCLELLAND, MAIER
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& NEUSTADT, P.C.
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1755 JEFFERSON DAVIS HIGHWAY, 4TH FLOOR
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ARLINGTON, VA 22202
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