Patent Assignment Details
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| Reel/Frame: | 013404/0458 | |
| Pages: | 3 |
| | Recorded: | 10/21/2002 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/13/2002
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Application #:
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09603592
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Filing Dt:
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06/26/2000
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Title:
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METHOD AND SYSTEM FOR SEMICONDUCTOR TESTING USING YIELD CORRELATION BETWEEN GLOBAL AND CLASS PARAMETERS
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Assignee
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| 6000 TECHNOLOGY BLVD. |
| SANDSTON, VIRGINIA 23150 |
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Correspondence name and address
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SIEMENS CORPORTION
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ELSA KELLER
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186 WOOD AVENUE SOUTH
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INTELLECTUAL PROPERTY DEPARTMENT
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ISELIN, NJ 08830
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