Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 023621/0459 | |
| Pages: | 3 |
| | Recorded: | 12/08/2009 | | |
| Attorney Dkt #: | 40006317-0255-002 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/28/2012
|
Application #:
|
12566448
|
Filing Dt:
|
09/24/2009
|
|
Publication #:
|
|
Pub Dt:
|
03/25/2010
| | | | |
|
Title:
|
WAFER DEFECT DETECTION SYSTEM AND METHOD
|
|
|
Assignee
|
|
|
|
|
| 9 OPPENHEIMER ST. |
| REHOVOT, ISRAEL 76236 |
|
|
Correspondence name and address
|
| |
APPLIED MATERIALS, INC. C/O SONNENSCHEIN
|
| |
P.O. BOX 061080
|
| |
WACKER DRIVE STATION, WILLIS TOWER
|
| |
CHICAGO, IL 60606-1080
|
Search Results as of:
05/27/2024 10:59 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
