Patent Assignment Details
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| Reel/Frame: | 018522/0471 | |
| Pages: | 2 |
| | Recorded: | 11/06/2006 | | |
| Attorney Dkt #: | 0009.1014 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/21/2011
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Application #:
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11593090
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Filing Dt:
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11/06/2006
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Publication #:
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Pub Dt:
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05/29/2008
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Title:
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METHOD OF MEASURING DEGREE OF CRYSTALLINITY OF POLYCRYSTALLINE SILICON SUBSTRATE, METHOD OF FABRICATING ORGANIC LIGHT EMITTING DISPLAY USING THE SAME, AND ORGANIC LIGHT EMITTING DISPLAY FABRICATED USING THE SAME
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Assignee
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| 575, SHIN-DONG, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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Correspondence name and address
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STEIN MCEWEN & BUI, LLP
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ATTENTION: MICHAEL D. STEIN
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1400 EYE ST., N.W., SUITE 300
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WASHINGTON, DC 20005
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