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Reel/Frame:034008/0526   Pages: 8
Recorded: 10/22/2014
Attorney Dkt #:KLA P4485
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
06/21/2016
Application #:
14520998
Filing Dt:
10/22/2014
Publication #:
Pub Dt:
03/10/2016
Title:
ENHANCED PATTERNED WAFER GEOMETRY MEASUREMENTS BASED DESIGN IMPROVEMENTS FOR OPTIMAL INTEGRATED CHIP FABRICATION PERFORMANCE
Assignors
1
Exec Dt:
10/08/2014
2
Exec Dt:
10/09/2014
3
Exec Dt:
10/09/2014
4
Exec Dt:
10/21/2014
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
14301 FNB PARKWAY
SUITE 220
OMAHA, NE 68154-5299

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