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Patent Assignment Details

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Reel/Frame:	022619/0529			Pages:	4
		Recorded:	04/30/2009
Attorney Dkt #:	APPLIED MATERIALS
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 13

Patent #:	6049220	Issue Dt:	04/11/2000	Application #:	09095804	Filing Dt:	06/10/1998
Title:	APPARATUS AND METHOD FOR EVALUATING A WAFER OF SEMICONDUCTOR MATERIAL

Patent #:	6323951	Issue Dt:	11/27/2001	Application #:	09274821	Filing Dt:	03/22/1999
Title:	APPARATUS AND METHOD FOR DETERMINING THE ACTIVE DOPANT PROFILE IN A SEMICONDUCTOR WAFER

Patent #:	6489801	Issue Dt:	12/03/2002	Application #:	09544280	Filing Dt:	04/06/2000
Title:	APPARATUS AND METHOD FOR EVALUATING A WAFER OF SEMICONDUCTOR MATERIAL

Patent #:	6812717	Issue Dt:	11/02/2004	Application #:	09799481	Filing Dt:	03/05/2001
Publication #:	US20020167326	Pub Dt:	11/14/2002
Title:	USE OF COEFFICIENT OF A POWER CURVE TO EVALUATE A SEMICONDUCTOR WAFER

Patent #:	6426644	Issue Dt:	07/30/2002	Application #:	09935128	Filing Dt:	08/21/2001
Publication #:	US20020027660	Pub Dt:	03/07/2002
Title:	APPARATUS AND METHOD FOR DETERMINING THE ACTIVE DOPANT PROFILE IN A SEMICONDUCTOR WAFER

Patent #:	6483594	Issue Dt:	11/19/2002	Application #:	09994441	Filing Dt:	11/26/2001
Publication #:	US20020085211	Pub Dt:	07/04/2002
Title:	APPARATUS AND METHOD FOR DETERMINING THE ACTIVE DOPANT PROFILE IN A SEMICONDUCTOR WAFER

Patent #:	6885458	Issue Dt:	04/26/2005	Application #:	10223952	Filing Dt:	08/19/2002
Publication #:	US20030043382	Pub Dt:	03/06/2003
Title:	APPARATUS AND METHOD FOR DETERMINING THE ACTIVE DOPANT PROFILE IN A SEMICONDUCTOR WAFER

Patent #:	6963393	Issue Dt:	11/08/2005	Application #:	10253119	Filing Dt:	09/23/2002
Publication #:	US20040057052	Pub Dt:	03/25/2004
Title:	MEASUREMENT OF LATERAL DIFFUSION OF DIFFUSED LAYERS

Patent #:	6878559	Issue Dt:	04/12/2005	Application #:	10253121	Filing Dt:	09/23/2002
Publication #:	US20040063225	Pub Dt:	04/01/2004
Title:	MEASUREMENT OF LATERAL DIFFUSION OF DIFFUSED LAYERS

Patent #:	7190458	Issue Dt:	03/13/2007	Application #:	10731991	Filing Dt:	12/09/2003
Publication #:	US20050122525	Pub Dt:	06/09/2005
Title:	USE OF SCANNING BEAM FOR DIFFERENTIAL EVALUATION OF ADJACENT REGIONS FOR CHANGE IN REFLECTIVITY

Patent #:	7136163	Issue Dt:	11/14/2006	Application #:	10732436	Filing Dt:	12/09/2003
Publication #:	US20050122515	Pub Dt:	06/09/2005
Title:	DIFFERENTIAL EVALUTION OF ADJACENT REGIONS FOR CHANGE IN REFLECTIVITY

Patent #:	7078711	Issue Dt:	07/18/2006	Application #:	10779072	Filing Dt:	02/13/2004
Publication #:	US20050181524	Pub Dt:	08/18/2005
Title:	MATCHING DOSE AND ENERGY OF MULTIPLE ION IMPLANTERS

Patent #:	7130055	Issue Dt:	10/31/2006	Application #:	10976587	Filing Dt:	10/29/2004
Publication #:	US20050088187	Pub Dt:	04/28/2005
Title:	USE OF COEFFICIENT OF A POWER CURVE TO EVALUATE A SEMICONDUCTOR WAFER

Assignor

Exec Dt:

04/02/2009

Assignee

PRIELLE KORNELIA U.2., H-1117

BUDAPEST, HUNGARY

Correspondence name and address
	SILICON VALLEY PATENT GROUP LLP
	18805 COX AVENUE
	SUITE 220
	SARATOGA, CA 95070

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