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Reel/Frame:063008/0534   Pages: 7
Recorded: 03/16/2023
Attorney Dkt #:IS23-0106
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
18026822
Filing Dt:
03/16/2023
Publication #:
Pub Dt:
10/12/2023
Title:
METHOD FOR MEASURING CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED BY MEANS OF MEASURING APPARATUS USING VARIABLE SET POINT SETTING, ATOMIC MICROSCOPE FOR PERFORMING METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM FOR PERFORMING METHOD
Assignors
1
Exec Dt:
03/03/2023
2
Exec Dt:
03/03/2023
3
Exec Dt:
03/03/2023
4
Exec Dt:
03/07/2023
Assignee
1
KANC 4TH FLOOR, 109, GWANGGYO-RO, YEONGTONG-GU
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16229
Correspondence name and address
INVENSTONE PATENT, LLC.
7925 JONES BRANCH DR SUITE 3100-A
MCLEAN, VA 22102

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