Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 032421/0536 | |
| Pages: | 101 |
| | Recorded: | 03/09/2014 | | |
| Attorney Dkt #: | 1LG-HYUNDAI |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
8
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/08/1996
|
Application #:
|
08419264
|
Filing Dt:
|
04/10/1995
|
|
Title:
|
METHOD FOR FORMING RUGGED TUNGSTEN FILM AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE UTILIZING THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/19/2002
|
Application #:
|
08675692
|
Filing Dt:
|
07/03/1996
|
|
Title:
|
METHOD FOR FORMING RUGGED TUNGSTEN FILM AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE UTILIZING THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/17/2000
|
Application #:
|
09084982
|
Filing Dt:
|
05/28/1998
|
|
Title:
|
SEMICONDUCTOR DEVICE WITH DIAGONAL CAPACITOR BIT LINE AND FABRICATION METHOD THEREOF
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/26/2002
|
Application #:
|
09342514
|
Filing Dt:
|
06/29/1999
|
|
Title:
|
TDDB TEST PATTERN AND METHOD FOR TESTING TDDB OF MOS CAPACITOR DIELECTRIC
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/05/2002
|
Application #:
|
09660337
|
Filing Dt:
|
09/12/2000
|
|
Title:
|
Fabrication Method of Semiconductor Device with Diagonal Capacitor Bit Line
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
08/24/2004
|
Application #:
|
09995680
|
Filing Dt:
|
11/29/2001
|
|
Publication #:
|
|
Pub Dt:
|
03/21/2002
| | | | |
|
Title:
|
TDDB TEST PATTERN AND METHOD FOR TESTING TDDB OF MOS CAPACITOR DIELECTRIC
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/30/2007
|
Application #:
|
10895285
|
Filing Dt:
|
07/21/2004
|
|
Publication #:
|
|
Pub Dt:
|
12/23/2004
| | | | |
|
Title:
|
TDDB TEST PATTERN AND METHOD FOR TESTING TDDB OF MOS CAPACITOR DIELECTRIC
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/20/2009
|
Application #:
|
11643656
|
Filing Dt:
|
12/22/2006
|
|
Publication #:
|
|
Pub Dt:
|
05/10/2007
| | | | |
|
Title:
|
TDDB TEST PATTERN AND METHOD FOR TESTING TDDB OF MOS CAPACITOR DIELECTRIC
|
|
|
Assignee
|
|
|
|
|
| HYANGJEONG-DONG, HEUNGDEOK-GU |
| CHUNGCHEONGBUK-DO |
| CHEONGJU-SI, KOREA, REPUBLIC OF |
|
|
Correspondence name and address
|
| |
H.C. PARK & ASSOCIATES, PLC
|
| |
1894 PRESTON WHITE DRIVE
|
| |
RESTON, VA 20191
|
Search Results as of:
05/24/2024 04:53 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
