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Reel/Frame:016251/0560   Pages: 5
Recorded: 02/02/2005
Attorney Dkt #:CHRT-00171
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11049337
Filing Dt:
02/02/2005
Publication #:
Pub Dt:
08/03/2006
Title:
Novel fluorescent and photoemission apparatus and method for submicron IC failure analysis
Assignors
1
Exec Dt:
12/07/2004
2
Exec Dt:
12/12/2004
3
Exec Dt:
11/24/2004
4
Exec Dt:
01/05/2005
Assignee
1
60 WOODLANDS INDUSTRIAL PARK D
STREET 2, SINGAPORE 738406
Correspondence name and address
JOHN P. WAGNER, JR.
WAGNER, MURABITO & HAO LLP
TWO NORTH MARKET STREET, THIRD FLOOR
SAN JOSE, CA 95113

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