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Total properties:
17
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Patent #:
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Issue Dt:
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09/11/1990
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Application #:
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07199008
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Filing Dt:
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05/26/1988
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Title:
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HIGH DENSITY DATA STORAGE AND RETRIEVAL SYSTEM
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Patent #:
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Issue Dt:
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04/23/1991
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Application #:
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07239365
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Filing Dt:
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08/31/1988
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Title:
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DIFFERENTIAL FORCE BALANCE APPARATUS
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Patent #:
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Issue Dt:
|
08/28/1990
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Application #:
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07328422
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Filing Dt:
|
03/24/1989
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Title:
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SCANNING MICROMECHANICAL PROBE CONTROL SYSTEM
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Patent #:
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Issue Dt:
|
11/06/1990
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Application #:
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07328429
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Filing Dt:
|
03/24/1989
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Title:
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HIGH RESOLUTION ELECTROMECHANICAL TRANSLATION DEVICE
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Patent #:
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Issue Dt:
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10/26/1993
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Application #:
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07482042
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Filing Dt:
|
02/20/1990
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Title:
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SEARCH POSITION ENCODER
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Patent #:
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Issue Dt:
|
11/09/1993
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Application #:
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07765082
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Filing Dt:
|
09/24/1991
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Title:
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HIGH RESOLUTION ELECTROMECHANICAL TRANSLATION DEVICE
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Patent #:
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Issue Dt:
|
03/08/1994
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Application #:
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07845919
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Filing Dt:
|
03/04/1992
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Title:
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SCANNING FORCE MICROSCOPE WITH INTEGRATED OPTICS AND CANTILEVER MOUNT
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Patent #:
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Issue Dt:
|
06/14/1994
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Application #:
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07847160
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Filing Dt:
|
03/06/1992
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Title:
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SCANNING FORCE MICROSCOPE
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|
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Patent #:
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|
Issue Dt:
|
01/09/1996
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Application #:
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08055236
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Filing Dt:
|
04/28/1993
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Title:
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RESONANCE CONTACT SCANNING FORCE MICROSCOPE
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Patent #:
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|
Issue Dt:
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04/18/1995
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Application #:
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08086592
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Filing Dt:
|
07/02/1993
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Title:
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SYNCHRONOUS SAMPLING SCANNING FORCE MICROSCOPE
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Patent #:
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|
Issue Dt:
|
08/15/1995
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Application #:
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08127661
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Filing Dt:
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09/27/1993
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Title:
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THERMAL SENSING SCANNING PROBE MICROSCOPE AND METHOD FOR MEASUREMENT OF THERMAL PARAMETERS OF A SPECIMEN
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Patent #:
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Issue Dt:
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10/03/1995
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Application #:
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08273740
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Filing Dt:
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07/12/1994
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Title:
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SCANNING PROBE MICROSCOPE APPARATUS FOR USE IN A SCANNING ELECTRON MICROSCOPE
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|
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Patent #:
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Issue Dt:
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11/28/1995
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Application #:
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08357133
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Filing Dt:
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12/15/1994
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|
Title:
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SCANNING APPARATUS LINEARIZATION AND CALIBRATION SYSTEM
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|
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Patent #:
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|
Issue Dt:
|
04/16/1996
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Application #:
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08360588
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Filing Dt:
|
12/21/1994
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|
Title:
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SYNCHRONOUS SAMPLING SCANNING FORCE MICROSCOPE
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|
|
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Patent #:
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|
Issue Dt:
|
04/23/1996
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Application #:
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08478479
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Filing Dt:
|
06/07/1995
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|
Title:
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SCANNING PROBE MICROSCOPE APPARATUS FOR USE IN A SCANNING ELECTRON MICROSCOPE
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|
|
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Patent #:
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|
Issue Dt:
|
04/29/1997
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Application #:
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08500544
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Filing Dt:
|
07/11/1995
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|
Title:
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RESONANCE CONTACT SCANNING FORCE MICROSCOPE
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|
|
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Patent #:
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|
Issue Dt:
|
06/24/1997
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Application #:
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08560827
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Filing Dt:
|
11/20/1995
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|
Title:
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SCANNING APPARATUS LINEARIZATION AND CALIBRATION SYSTEM
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