Patent Assignment Details
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| Reel/Frame: | 056411/0609 | |
| Pages: | 20 |
| | Recorded: | 06/02/2021 | | |
| Attorney Dkt #: | BP00001 |
| Conveyance: | LICENSE (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/12/2017
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Application #:
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14442081
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Filing Dt:
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05/11/2015
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Publication #:
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Pub Dt:
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10/22/2015
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Title:
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METHOD FOR MEASURING THICKNESS VARIATIONS IN A LAYER OF A MULTILAYER SEMICONDUCTOR STRUCTURE
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Assignee
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| MANFRED-VON-ARDENNE-RING 4 |
| DRESDEN, GERMANY 01099 |
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Correspondence name and address
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COLSON LAW GROUP
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5555 MAIN STREET
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BUFFALO, NY 14221
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