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Total properties:
13
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Patent #:
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Issue Dt:
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10/18/2005
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Application #:
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10631469
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Filing Dt:
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07/29/2003
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Publication #:
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Pub Dt:
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08/05/2004
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Title:
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SEMICONDUCTOR WAFER INSPECTION SYSTEM
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Patent #:
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Issue Dt:
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09/05/2006
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Application #:
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10710836
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Filing Dt:
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08/05/2004
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Publication #:
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Pub Dt:
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03/17/2005
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Title:
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INSPECTION SYSTEM AND APPARATUS
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Patent #:
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Issue Dt:
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12/11/2007
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Application #:
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10771628
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Filing Dt:
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02/03/2004
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Publication #:
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Pub Dt:
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12/02/2004
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Title:
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WAFER INSPECTION SYSTEM
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Patent #:
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Issue Dt:
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12/26/2006
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Application #:
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10897758
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Filing Dt:
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07/23/2004
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Publication #:
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Pub Dt:
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01/27/2005
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Title:
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MEASUREMENT OF MOTIONS OF ROTATING SHAFTS USING NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR
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Patent #:
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Issue Dt:
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04/29/2008
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Application #:
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11001452
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Filing Dt:
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12/01/2004
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Publication #:
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Pub Dt:
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06/01/2006
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Title:
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CONRAD BEARING CAGE
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Patent #:
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Issue Dt:
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09/12/2006
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Application #:
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11078255
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Filing Dt:
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03/11/2005
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Publication #:
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Pub Dt:
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07/28/2005
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Title:
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INSPECTION SYSTEM AND APPARATUS
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Patent #:
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Issue Dt:
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08/15/2006
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Application #:
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11156088
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Filing Dt:
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06/17/2005
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Publication #:
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Pub Dt:
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10/20/2005
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Title:
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SEMICONDUCTOR WAFER INSPECTION SYSTEM
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Patent #:
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Issue Dt:
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05/27/2008
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Application #:
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11504486
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Filing Dt:
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08/15/2006
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Publication #:
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Pub Dt:
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12/07/2006
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Title:
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SEMICONDUCTOR WAFER INSPECTION SYSTEM
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Patent #:
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Issue Dt:
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02/26/2008
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Application #:
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11519501
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Filing Dt:
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09/12/2006
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Publication #:
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Pub Dt:
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01/11/2007
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Title:
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INSPECTION SYSTEM AND APPARATUS
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Patent #:
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Issue Dt:
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02/09/2010
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Application #:
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11715149
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Filing Dt:
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03/07/2007
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Publication #:
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Pub Dt:
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09/11/2008
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Title:
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SEMICONDUCTOR INSPECTION SYSTEM AND APPARATUS UTILIZING A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR AND CONTROLLED ILLUMINATION
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Patent #:
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Issue Dt:
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03/08/2011
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Application #:
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11948518
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Filing Dt:
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11/30/2007
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Publication #:
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Pub Dt:
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06/04/2009
| | | | |
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Title:
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DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR
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Patent #:
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Issue Dt:
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07/06/2010
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Application #:
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12151054
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Filing Dt:
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05/02/2008
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Publication #:
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Pub Dt:
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11/05/2009
| | | | |
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Title:
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CALIBRATION OF NON-VIBRATING CONTACT POTENTIAL DIFFERENCE MEASUREMENTS TO DETECT SURFACE VARIATIONS THAT ARE PERPENDICULAR TO THE DIRECTION OF SENSOR MOTION
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Patent #:
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Issue Dt:
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09/25/2012
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Application #:
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12694116
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Filing Dt:
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01/26/2010
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Publication #:
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Pub Dt:
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08/05/2010
| | | | |
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Title:
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PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR
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