Total properties:
10
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Patent #:
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Issue Dt:
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07/16/1991
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Application #:
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07565289
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Filing Dt:
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08/09/1990
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Title:
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MULTICHANNEL CHARGED-PARTICLE ANALYZER
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Patent #:
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Issue Dt:
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05/24/1994
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Application #:
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07953429
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Filing Dt:
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09/29/1992
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Title:
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SCANNING AND HIGH RESOLUTION X-RAY PHOTOELECTRON SPECTROSCOPY AND IMAGING
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Patent #:
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Issue Dt:
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08/22/1995
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Application #:
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08201912
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Filing Dt:
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02/25/1994
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Title:
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SCANNING AND HIGH RESOLUTION ELECTRON SPECTROSCOPY AND IMAGING
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Patent #:
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Issue Dt:
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02/11/1997
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Application #:
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08593308
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Filing Dt:
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01/31/1996
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Title:
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ANODE ASSEMBLY FOR GENERATING X-RAYS AND INSTRUMENT WITH SUCH ANODE ASSEMBLY
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Patent #:
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Issue Dt:
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11/23/1999
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Application #:
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08968454
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Filing Dt:
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11/12/1997
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Title:
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CONTROL OF SURFACE POTENTIAL OF INSULATING SPECIMENS IN SURFACE ANALYSIS
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Patent #:
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Issue Dt:
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05/10/2005
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Application #:
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10330317
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Filing Dt:
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12/27/2002
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Publication #:
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Pub Dt:
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07/01/2004
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Title:
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NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS BASED ON ACQUIRED SPECTRUM
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Patent #:
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Issue Dt:
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10/05/2004
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Application #:
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10330383
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Filing Dt:
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12/27/2002
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Publication #:
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Pub Dt:
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07/15/2004
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Title:
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NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS USING MEASURED BASIS SPECTRA
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Patent #:
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Issue Dt:
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11/11/2008
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Application #:
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10493492
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Filing Dt:
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04/22/2004
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Publication #:
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Pub Dt:
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12/02/2004
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Title:
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SYSTEM AND METHOD FOR DEPTH PROFILING AND CHARACTERIZATION OF THIN FILMS
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Patent #:
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Issue Dt:
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05/18/2010
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Application #:
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11040329
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Filing Dt:
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01/20/2005
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Publication #:
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Pub Dt:
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08/24/2006
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Title:
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SEMICONDUCTOR SUBSTRATE PROCESSING METHOD AND APPARATUS
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Patent #:
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Issue Dt:
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08/09/2011
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Application #:
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12781714
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Filing Dt:
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05/17/2010
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Publication #:
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Pub Dt:
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09/09/2010
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Title:
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SEMICONDUCTOR SUBSTRATE PROCESSING METHOD AND APPARATUS
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