Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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Reel/Frame: | 014250/0677 | |
| Pages: | 3 |
| | Recorded: | 07/14/2003 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
8
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Patent #:
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Issue Dt:
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11/26/2002
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Application #:
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08637250
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Filing Dt:
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04/24/1996
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Title:
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APPARATUS FOR X-RAY ANALYSIS WITH A SIMPLIFIED DETECTOR MOTION
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Patent #:
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Issue Dt:
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09/17/2002
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Application #:
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09621523
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Filing Dt:
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07/21/2000
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Title:
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RADIATION DETECTOR PROVIDED WITH AN ABSORPTION CHAMBER AND A PLURALITY OF AVALANCHE CHAMBERS
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Patent #:
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Issue Dt:
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09/03/2002
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Application #:
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09621524
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Filing Dt:
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07/21/2000
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Title:
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APPARATUS FOR RADIATION ANALYSIS WITH A VARIABLE COLLIMATOR
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Patent #:
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Issue Dt:
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05/21/2002
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Application #:
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09747106
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Filing Dt:
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12/21/2000
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Publication #:
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Pub Dt:
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08/16/2001
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Title:
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X-RAY ANALYSIS APPARATUS WITH AN X-RAY DETECTOR IN THE FORM OF A CCD ARRAY
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Patent #:
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Issue Dt:
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03/09/2004
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Application #:
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09862287
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Filing Dt:
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05/22/2001
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Publication #:
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Pub Dt:
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01/10/2002
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Title:
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X-RAY ANALYSIS APPARATUS PROVIDED WITH A MULTILAYER MIRROR AND AN EXIT COLLIMATOR
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Patent #:
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Issue Dt:
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11/09/2004
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Application #:
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10008335
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Filing Dt:
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11/08/2001
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Publication #:
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Pub Dt:
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05/09/2002
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Title:
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ANALYTICAL X-RAY APPARATUS PROVIDED WITH A SOLID STATE POSITION SENSITIVE X-RAY DETECTOR
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Patent #:
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Issue Dt:
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05/04/2004
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Application #:
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10022150
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Filing Dt:
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12/13/2001
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Publication #:
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Pub Dt:
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06/20/2002
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Title:
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X-RAY DIFFRACTOMETER
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Patent #:
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Issue Dt:
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11/23/2004
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Application #:
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10179323
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Filing Dt:
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06/25/2002
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Publication #:
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Pub Dt:
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01/16/2003
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Title:
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DETERMINATION OF MATERIAL PARAMETERS
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Assignee
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LELYWEG 1 |
7602 EA ALMELO, NETHERLANDS |
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Correspondence name and address
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PHILIPS ELECTRONICS NORTH AMERICA CORP.
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AARON WAXLER
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P.O. BOX 3001
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BRIARCLIFF MANOR, NY 10510
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