Patent Assignment Details
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| Reel/Frame: | 014418/0681 | |
| Pages: | 3 |
| | Recorded: | 08/25/2003 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/26/2004
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Application #:
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10458871
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Filing Dt:
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06/11/2003
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Publication #:
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Pub Dt:
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12/11/2003
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Title:
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METHOD FOR INSPECTING WAFER DEFECTS OF A SEMICONDUCTOR DEVICE
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Assignee
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| REPUBLIC OF KOREA |
| 891-10 DAECHI-DONG, GANGNAM-GU |
| SEOUL, KOREA, REPUBLIC OF |
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Correspondence name and address
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GROSSMAN & FLIGHT, LLC
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MARK C. ZIMMERMAN
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20 NORTH WACKER DRIVE, SUITE 4220
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CHICAGO, IL 60606
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