Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 014250/0684 | |
| Pages: | 3 |
| | Recorded: | 07/14/2003 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
4
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Patent #:
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Issue Dt:
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10/12/1999
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Application #:
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08828466
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Filing Dt:
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03/28/1997
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Title:
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ARC DIFFRACTOMETER
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Patent #:
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Issue Dt:
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05/01/2001
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Application #:
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09211921
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Filing Dt:
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12/15/1998
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Title:
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X-RAY DIFFRACTOMETER METHOD FOR DETERMINING THICKNESS OF MULTIPLE NON-METALLIC CRYSTALLINE LAYERS AND FOURIER TRANSFORM METHOD
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Patent #:
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Issue Dt:
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12/21/1999
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Application #:
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09365800
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Filing Dt:
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08/03/1999
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Title:
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ARC DIFFRACTOMETER
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Patent #:
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Issue Dt:
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02/19/2002
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Application #:
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09561508
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Filing Dt:
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04/27/2000
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Title:
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Method and device using x-rays to measure thickness and composiiton of thin films
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Assignee
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| LELYWEG 1 |
| 7602 EA ALMELO, NETHERLANDS |
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Correspondence name and address
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PHILIPS INTELLECTUAL PROPERTY
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& STANDARDS
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AARON WAXLER
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P.O. BOX 3001
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BRIARCLIFF MANOR, NY 10510
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