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Reel/Frame:027665/0708   Pages: 4
Recorded: 02/07/2012
Attorney Dkt #:L11-1375US1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
02/04/2014
Application #:
13341998
Filing Dt:
12/31/2011
Publication #:
Pub Dt:
07/04/2013
Title:
Scan Test Circuitry with Delay Defect Bypass Functionality
Assignors
1
Exec Dt:
01/17/2012
2
Exec Dt:
01/17/2012
Assignee
1
1621 BARBER LANE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
RYAN, MASON & LEWIS, LLP
90 FOREST AVENUE
JOSEPH B. RYAN
LOCUST VALLEY, NY 11560

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