Patent Assignment Details
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| Reel/Frame: | 043857/0712 | |
| Pages: | 5 |
| | Recorded: | 10/13/2017 | | |
| Attorney Dkt #: | 1606.128185 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/02/2018
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Application #:
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15515227
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Filing Dt:
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03/29/2017
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Publication #:
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Pub Dt:
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08/03/2017
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Title:
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METHOD AND SYSTEM FOR INSPECTING WAFERS FOR ELECTRONICS, OPTICS OR OPTOELECTRONICS
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Assignee
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| 611 RUE ARISTIDE BERGÈS |
| ZAC DE PRÉ MILLET |
| MONTBONNOT-SAINT-MARTIN, FRANCE F-38330 |
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Correspondence name and address
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GREER, BURNS & CRAIN, LTD.
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300 SOUTH WACKER DRIVE
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SUITE 2500
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CHICAGO, IL 60606
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