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Reel/Frame:041178/0725   Pages: 3
Recorded: 12/22/2016
Attorney Dkt #:NAN309 US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
05/14/2019
Application #:
15388794
Filing Dt:
12/22/2016
Publication #:
Pub Dt:
06/07/2018
Title:
SCANNING WHITE-LIGHT INTERFEROMETRY SYSTEM FOR CHARACTERIZATION OF PATTERNED SEMICONDUCTOR FEATURES
Assignors
1
Exec Dt:
12/21/2016
2
Exec Dt:
12/21/2016
Assignee
1
1550 BUCKEYE DRIVE
MILPITAS, CALIFORNIA 95035-7418
Correspondence name and address
SILICON VALLEY PATENT GROUP LLP
4010 MOORPARK AVENUE
SUITE 210
SAN JOSE, CA 95117

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